CY7C1049DV33-10VXIT Cypress Semiconductor Corp, CY7C1049DV33-10VXIT Datasheet - Page 4

• Manufacturer Part Number: CY7C1049DV33-10VXIT
• Description: IC SRAM 4MBIT 10NS 36-SOJ
• Manufacturer: Cypress Semiconductor Corp
• Type: Asynchronousr

Specifications of CY7C1049DV33-10VXIT

• Memory Size: 4M (512K x 8)
• Package / Case: 36-SOJ
• Format - Memory: RAM
• Memory Type: SRAM - Asynchronous
• Speed: 10ns
• Interface: Parallel
• Voltage - Supply: 3 V ~ 3.6 V
• Operating Temperature: -40°C ~ 85°C
• Access Time: 10 ns
• Supply Voltage (max): 3.6 V
• Supply Voltage (min): 3 V
• Maximum Operating Current: 90 mA
• Maximum Operating Temperature: + 85 C
• Minimum Operating Temperature: - 40 C
• Mounting Style: SMD/SMT
• Number Of Ports: 1
• Operating Supply Voltage: 3.3 V
• Memory Configuration: 512K X 8
• Supply Voltage Range: 3V To 3.6V
• Memory Case Style: SOJ
• No. Of Pins: 36
• Operating Temperature Range: -40°C To +85°C
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant, Lead free / RoHS Compliant

Thermal Resistance
Tested initially and after any design or process changes that may affect these parameters.
AC Test Loads and Waveforms
Data Retention Characteristics
Over the Operating Range
Note
Document Number: 38-05475 Rev. *F
V
I
t
t
3. Tested initially and after any design or process changes that may affect these parameters.
4. AC characteristics (except High Z) are tested using the load conditions shown in
5. No input may exceed V
6. Full device operation requires linear V
CCDR
CDR
R
Parameter
Parameter
DR
[6]
Figure (c).


[3]
JA
JC
V
10 ns device
* CAPACITIVE LOAD CONSISTS
OF ALL COMPONENTS OF THE
TEST ENVIRONMENT
CE
CC
Thermal Resistance
(Junction to Ambient)
Thermal Resistance
(Junction to Case)
V
Data Retention Current
Chip Deselect to Data Retention Time
Operation Recovery Time
CC
OUTPUT
High Z characteristics:
for Data Retention
CC
+ 0.3V.
Description
Description
Z = 50
CC
ramp from V
OUTPUT
3.3V
t
(a)
CDR
Figure 1. AC Test Loads and Waveforms
1.5V
50
3.0V
DR
Figure 2. Data Retention Waveform
to V
Still Air, soldered on a 3 × 4.5 inch,
5 pF
CC(min.)
two layer printed circuit board
(c)
30 pF*
> 50 s or stable at V
V
V
Test Conditions
R 317
CC
IN
DATA RETENTION MODE
> V
= V
CC
351
DR
Figure
V
R2
GND
3.0V
DR
Rise Time: 1 V/ns
– 0.3V or V
= 2.0V, CE > V
> 2V
1. High Z characteristics are tested for all speeds using the test load shown in
CC(min.)
Conditions
IN
> 50 s.
< 0.3V
10%
CC
90%
– 0.3V
[4]
Package
57.91
36.73
[5]
SOJ
ALL INPUT PULSES
3.0V
(b)
t
R
Package
CY7C1049DV33
TSOP II
Auto
Ind’l
50.66
17.17
Fall Time: 1 V/ns
90%
10%
Min
t
2.0
RC
0
Page 4 of 11
Max
10
15
C/W
C/W
Unit
Unit
mA
mA
ns
ns
V
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