CY7C1021CV33-10BAXIT Cypress Semiconductor Corp, CY7C1021CV33-10BAXIT Datasheet - Page 6
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CY7C1021CV33-10BAXIT
Manufacturer Part Number
CY7C1021CV33-10BAXIT
Description
IC SRAM 1MBIT 10NS 48LFBGA
Manufacturer
Cypress Semiconductor Corp
Datasheet
1.CY7C1021CV33-10ZSXA.pdf
(14 pages)
Specifications of CY7C1021CV33-10BAXIT
Format - Memory
RAM
Memory Type
SRAM - Asynchronous
Memory Size
1M (64K x 16)
Speed
10ns
Interface
Parallel
Voltage - Supply
3 V ~ 3.6 V
Operating Temperature
-40°C ~ 85°C
Package / Case
48-LFBGA
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Available stocks
Company
Part Number
Manufacturer
Quantity
Price
Company:
Part Number:
CY7C1021CV33-10BAXIT
Manufacturer:
Cypress Semiconductor Corp
Quantity:
10 000
Switching Characteristics
Over the Operating Range
Notes
Document Number: 38-05132 Rev. *I
Read Cycle
t
t
t
t
t
t
t
t
t
t
t
t
t
t
t
Write Cycle
t
t
t
t
t
t
t
t
t
t
t
5. Test conditions assume signal transition time of 3 ns or less, timing reference levels of 1.5V, and input pulse levels of 0 to 3.0V.
6. t
7. At any temperature and voltage condition, t
8. t
9. This parameter is guaranteed by design and is not tested.
10. The internal write time of the memory is defined by the overlap of CE LOW, WE LOW, and BHE/BLE LOW. CE, WE, and BHE/BLE is LOW to initiate a write. The
power
RC
AA
OHA
ACE
DOE
LZOE
HZOE
LZCE
HZCE
PU
PD
DBE
LZBE
HZBE
WC
SCE
AW
HA
SA
PWE
SD
HD
LZWE
HZWE
BW
Parameter
[9]
[9]
mV from steady state voltage.
transition of these signals terminate the write. The input data setup and hold timing is referenced to the leading edge of the signal that terminates the write.
POWER
HZOE
[6]
, t
HZBE
gives the minimum amount of time that the power supply is at typical V
[10]
, t
HZCE
V
Read Cycle Time
Address to Data Valid
Data Hold from Address Change
CE LOW to Data Valid
OE LOW to Data Valid
OE LOW to Low Z
OE HIGH to High Z
CE LOW to Low Z
CE HIGH to High Z
CE LOW to Power Up
CE HIGH to Power Down
Byte Enable to Data Valid
Byte Enable to Low Z
Byte Disable to High Z
Write Cycle Time
CE LOW to Write End
Address Setup to Write End
Address Hold from Write End
Address Setup to Write Start
WE Pulse Width
Data Setup to Write End
Data Hold from Write End
WE HIGH to Low Z
WE LOW to High Z
Byte Enable to End of Write
CC
, and t
(Typical) to the First Access
HZWE
Description
[5]
are specified with a load capacitance of 5 pF as in part (d) of
[7]
[7]
[7, 8]
[7]
[7, 8]
[7, 8]
HZCE
is less than t
LZCE
Min
100
8
3
0
3
0
0
8
7
7
0
0
6
5
0
3
6
, t
HZOE
-8
is less than t
Max
8
8
5
4
4
8
5
4
4
CC
values until the first memory access is performed.
LZOE
Min
100
10
10
3
0
3
0
0
8
0
7
5
0
3
7
8
0
, and t
“AC Test Loads and Waveforms”
-10
HZWE
Max
10
10
10
5
5
5
5
5
5
is less than t
Min
100
12
12
3
0
3
0
0
9
9
0
0
8
6
0
3
8
LZWE
-12
Max
for any given device.
12
12
12
6
6
6
6
6
6
on page 5. Transition is measured ±500
CY7C1021CV33
Min
100
15
15
10
10
10
3
0
3
0
0
0
0
8
0
3
9
-15
Max
15
15
15
7
7
7
7
7
7
Page 6 of 14
Unit
μs
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
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