MAX4893BETB+T Maxim Integrated Products, MAX4893BETB+T Datasheet - Page 10

• Manufacturer Part Number: MAX4893BETB+T
• Description: IC CTLR OVP CURR LIMIT 10-TDFN
• Manufacturer: Maxim Integrated Products

Specifications of MAX4893BETB+T

• Applications: *
• Mounting Type: Surface Mount
• Package / Case: 10-TDFN Exposed Pad
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant

Overvoltage Protection Controllers with
Current Limit in TDFN
length, take care to prevent overshoots due to the LC
tank circuit, and provide protection if necessary to pre-
vent exceeding the 30V absolute maximum rating on IN.
The MAX4881–MAX4884/MAX4893B provide protection
against voltage faults up to 28V, but this does not
include negative voltages. If negative voltages are a
concern, connect a Schottky diode from IN to GND to
clamp negative input voltages.
Table 1. MOSFET Suggestions
Figure 9. Human Body Model Current Waveform
10
Figure 8. Human Body ESD Test Model
Si1426DH
FDG315N
AMPERES
VOLTAGE
SOURCE
PART
HIGH-
______________________________________________________________________________________
DC
I
P
36.8%
100%
90%
10%
CHARGE-CURRENT-
LIMIT RESISTOR
0
0
CONFIGURATION/
1MΩ
t
R
RL
100pF
C
Single/SC70-6
Single/SC70-6
PACKAGE
C s
STORAGE
CAPACITOR
CURRENT WAVEFORM
TIME
RESISTANCE
DISCHARGE
1.5kΩ
R
D
t
DL
I r
MAX (V)
PEAK-TO-PEAK RINGING
(NOT DRAWN TO SCALE)
V
30
30
DS
DEVICE
UNDER
AT 4.5V (mΩ)
TEST
R
115
160
ON
The MAX4881–MAX4884/MAX4893B provide an
exposed pad on the bottom of the package. This pad is
internally connected to GND. For the best thermal con-
ductivity and higher power dissipation, solder the
exposed pad to the ground plane. Do not use the
Figure 11. IEC 61000-4-2 ESD Generator Current
Figure 10. IEC 61000-4-2 ESD Test Model
Vishay Siliconix
http://www.vishay.com
[phone]
Fairchild Semiconductor
http://www.fairchildsemi.com
[phone]
VOLTAGE
t r = 0.7ns to 1ns
SOURCE
HIGH-
DC
CHARGE-CURRENT-
100%
LIMIT RESISTOR
90%
10%
I
50Ω to 100Ω
R
C
150pF
C s
MANUFACTURER
30ns
STORAGE
CAPACITOR
RESISTANCE
DISCHARGE
330Ω
R
60ns
D
Exposed Pad
DEVICE
UNDER
TEST
t