EVAL-AD5422EBZ Analog Devices Inc, EVAL-AD5422EBZ Datasheet - Page 10

• Manufacturer Part Number: EVAL-AD5422EBZ
• Description: BOARD EVAL FOR AD5422
• Manufacturer: Analog Devices Inc

Specifications of EVAL-AD5422EBZ

• Number Of Dac's: 1
• Number Of Bits: 16
• Outputs And Type: 1, Single Ended
• Sampling Rate (per Second): 1M
• Data Interface: Serial
• Settling Time: 32µs
• Dac Type: Current/Voltage
• Voltage Supply Source: Analog and Digital, Dual ±
• Operating Temperature: -40°C ~ 85°C
• Utilized Ic / Part: AD5422
• Silicon Manufacturer: Analog Devices
• Application Sub Type: DAC
• Kit Application Type: Data Converter
• Silicon Core Number: AD5422
• Kit Contents: Board And Literature
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant

AD5412/AD5422
ABSOLUTE MAXIMUM RATINGS
T
80 mA do not cause SCR latch-up.
Table 5.
Parameter
AV
AV
AV
DV
Digital Inputs to GND
Digital Outputs to GND
REFIN/REFOUT to GND
V
I
Operating Temperature Range (T
Storage Temperature Range
Junction Temperature (T
24-Lead TSSOP Package
40-Lead LFCSP Package
Power Dissipation
Lead Temperature
ESD (Human Body Model)
1
OUT
Power dissipated on chip must be derated to keep the junction temperature
below 125°C, assuming that the maximum power dissipation condition is
sourcing 24 mA into GND from I
OUT
A
Industrial
θ
θ
Soldering
DD
SS
DD
CC
= 25°C, unless otherwise noted. Transient currents of up to
to GND
JA
JA
to GND
to GND
to GND
to AV
to GND
Thermal Impedance
Thermal Impedance
SS
1
J
max)
OUT
with a 4 mA on-chip current.
A
)
Rating
−0.3 V to +48 V
+0.3 V to −28 V
−0.3 V to +60 V
−0.3 V to +7 V
−0.3 V to DV
−0.3 V to DV
−0.3 V to +7 V
AV
−0.3 V to AV
−40°C to +85°C
−65°C to +150°C
125°C
42°C/W
28°C/W
(T
JEDEC industry standard
J-STD-020
2 kV
(whichever is less)
(whichever is less)
J
SS
max – T
to AV
DD
A
)/θ
DD
CC
CC
JA
+ 0.3 V or 7 V
+ 0.3 V or 7 V
Rev. C | Page 10 of 40
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.
ESD CAUTION