ADUC7024BCPZ62 Analog Devices Inc, ADUC7024BCPZ62 Datasheet - Page 47

• Manufacturer Part Number: ADUC7024BCPZ62
• Description: IC MCU FLSH 62K ANLG I/O 64LFCSP
• Manufacturer: Analog Devices Inc
• Series: MicroConverter® ADuC7xxxr

Specifications of ADUC7024BCPZ62

• Core Size: 16/32-Bit
• Program Memory Size: 62KB (62K x 8)
• Design Resources: Sensing Low-g Acceleration Using ADXL345 Digital Accelerometer Connected to ADuC7024 (CN0133)
• Core Processor: ARM7
• Speed: 44MHz
• Connectivity: EBI/EMI, I²C, SPI, UART/USART
• Peripherals: PLA, PWM, PSM, Temp Sensor, WDT
• Number Of I /o: 30
• Program Memory Type: FLASH
• Ram Size: 8K x 8
• Voltage - Supply (vcc/vdd): 2.7 V ~ 3.6 V
• Data Converters: A/D 10x12b; D/A 2x12b
• Oscillator Type: Internal
• Operating Temperature: -40°C ~ 125°C
• Package / Case: 64-LFCSP
• Controller Family/series: (ARM7) ADUC
• No. Of I/o's: 30
• Ram Memory Size: 8KB
• Cpu Speed: 44MHz
• No. Of Timers: 4
• Digital Ic Case Style: LFCSP
• Embedded Interface Type: I2C, SPI, UART
• Rohs Compliant: Yes
• Package: 64LFCSP EP
• Device Core: ARM7TDMI
• Family Name: ADuC7xxx
• Maximum Speed: 44 MHz
• Operating Supply Voltage: 3.3 V
• Data Bus Width: 16|32 Bit
• Number Of Programmable I/os: 30
• Interface Type: I2C/SPI/UART
• On-chip Adc: 10-chx12-bit
• On-chip Dac: 2-chx12-bit
• Number Of Timers: 4
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant
• Eeprom Size: -
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant, Lead free / RoHS Compliant

NONVOLATILE FLASH/EE MEMORY
The ADuC7019/20/21/22/24/25/26/27/28/29 incorporate
Flash/EE memory technology on-chip to provide the user with
nonvolatile, in-circuit reprogrammable memory space.
Like EEPROM, flash memory can be programmed in-system
at a byte level, although it must first be erased. The erase is
performed in page blocks. As a result, flash memory is often
and more correctly referred to as Flash/EE memory.
Overall, Flash/EE memory represents a step closer to the
ideal memory device that includes nonvolatility, in-circuit
programmability, high density, and low cost. Incorporated in
the ADuC7019/20/21/22/24/25/26/27/28/29, Flash/EE memory
technology allows the user to update program code space in-
circuit, without the need to replace one-time programmable
(OTP) devices at remote operating nodes.
Each part contains a 64 kB array of Flash/EE memory. The
lower 62 kB is available to the user and the upper 2 kB contain
permanently embedded firmware, allowing in-circuit serial
download. These 2 kB of embedded firmware also contain a
power-on configuration routine that downloads factory-
calibrated coefficients to the various calibrated peripherals
(such as ADC, temperature sensor, and band gap references).
This 2 kB embedded firmware is hidden from user code.
Flash/EE Memory Reliability
The Flash/EE memory arrays on the parts are fully qualified for
two key Flash/EE memory characteristics: Flash/EE memory
cycling endurance and Flash/EE memory data retention.
Endurance quantifies the ability of the Flash/EE memory to be
cycled through many program, read, and erase cycles. A single
endurance cycle is composed of four independent, sequential
events, defined as
1.
2.
3.
4.
In reliability qualification, every half word (16-bit wide)
location of the three pages (top, middle, and bottom) in the
Flash/EE memory is cycled 10,000 times from 0x0000 to
0xFFFF. As indicated in Table 1, the Flash/EE memory
endurance qualification is carried out in accordance with
JEDEC Retention Lifetime Specification A117 over the
industrial temperature range of −40° to +125°C. The results
allow the specification of a minimum endurance figure over a
supply temperature of 10,000 cycles.
Initial page erase sequence
Read/verify sequence (single Flash/EE)
Byte program sequence memory
Second read/verify sequence (endurance cycle)
Rev. C | Page 47 of 96
Retention quantifies the ability of the Flash/EE memory to
retain its programmed data over time. Again, the parts are
qualified in accordance with the formal JEDEC Retention
Lifetime Specification (A117) at a specific junction temperature
(T
Flash/EE memory is cycled to its specified endurance limit,
described in Table 1, before data retention is characterized. This
means that the Flash/EE memory is guaranteed to retain its data
for its fully specified retention lifetime every time the Flash/EE
memory is reprogrammed. In addition, note that retention
lifetime, based on an activation energy of 0.6 eV, derates with T
as shown in Figure 51.
PROGRAMMING
The 62 kB of Flash/EE memory can be programmed in-circuit,
using the serial download mode or the provided JTAG mode.
Serial Downloading (In-Circuit Programming)
The ADuC7019/20/21/22/24/25/26/27/28/29 facilitate code
download via the standard UART serial port or via the I
The parts enter serial download mode after a reset or power
cycle if the BM pin is pulled low through an external 1 kΩ
resistor. After a part is in serial download mode, the user can
download code to the full 62 kB of Flash/EE memory while the
device is in-circuit in its target application hardware. An
executable PC serial download is provided as part of the
development system for serial downloading via the UART. The
AN-806 Application Note
downloading via the UART and I
JTAG Access
The JTAG protocol uses the on-chip JTAG interface to facilitate
code download and debug.
ADuC7019/20/21/22/24/25/26/27/28/29
J
= 85°C). As part of this qualification procedure, the
600
450
300
150
0
30
Figure 51. Flash/EE Memory Data Retention
40
JUNCTION TEMPERATURE (°C)
55
describes the protocol for serial
70
85
2
C.
100
125
135
150
2
C port.
J