ATMEGA162-16AUR Atmel, ATMEGA162-16AUR Datasheet - Page 206

MCU AVR 16KB FLASH 16MHZ 44TQFP

ATMEGA162-16AUR

Manufacturer Part Number
ATMEGA162-16AUR
Description
MCU AVR 16KB FLASH 16MHZ 44TQFP
Manufacturer
Atmel
Series
AVR® ATmegar
Datasheets

Specifications of ATMEGA162-16AUR

Core Processor
AVR
Core Size
8-Bit
Speed
16MHz
Connectivity
EBI/EMI, SPI, UART/USART
Peripherals
Brown-out Detect/Reset, POR, PWM, WDT
Number Of I /o
35
Program Memory Size
16KB (8K x 16)
Program Memory Type
FLASH
Eeprom Size
512 x 8
Ram Size
1K x 8
Voltage - Supply (vcc/vdd)
2.7 V ~ 5.5 V
Oscillator Type
Internal
Operating Temperature
-40°C ~ 85°C
Package / Case
44-TQFP, 44-VQFP
For Use With
ATSTK600-TQFP44 - STK600 SOCKET/ADAPTER 44-TQFPATSTK500 - PROGRAMMER AVR STARTER KIT
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Data Converters
-

Available stocks

Company
Part Number
Manufacturer
Quantity
Price
Part Number:
ATMEGA162-16AUR
Manufacturer:
Atmel
Quantity:
10 000
Boundary-scan Chain
Boundary-scan
Specific JTAG
Instructions
EXTEST; 0x0
206
ATmega162/V
Figure 86. Reset Register
The Boundary-scan Chain has the capability of driving and observing the logic levels on the dig-
ital I/O pins, as well as the boundary between digital and analog logic for analog circuitry having
Off-chip connections.
See
The Instruction Register is 4-bit wide, supporting up to 16 instructions. Listed below are the
JTAG instructions useful for Boundary-scan operation. Note that the optional HIGHZ instruction
is not implemented, but all outputs with tri-state capability can be set in high-impedant state by
using the AVR_RESET instruction, since the initial state for all port pins is tri-state.
As a definition in this datasheet, the LSB is shifted in and out first for all Shift Registers.
The OPCODE for each instruction is shown behind the instruction name in hex format. The text
describes which Data Register is selected as path between TDI and TDO for each instruction.
Mandatory JTAG instruction for selecting the Boundary-scan Chain as Data Register for testing
circuitry external to the AVR package. For port-pins, Pull-up Disable, Output Control, Output
Data, and Input Data are all accessible in the scan chain. For analog circuits having Off-chip
connections, the interface between the analog and the digital logic is in the scan chain. The con-
tents of the latched outputs of the Boundary-scan chain is driven out as soon as the JTAG IR-
Register is loaded with the EXTEST instruction.
The active states are:
Capture-DR: Data on the external pins are sampled into the Boundary-scan Chain.
Shift-DR: The Internal Scan Chain is shifted by the TCK input.
Update-DR: Data from the scan chain is applied to output pins.
“Boundary-scan Chain” on page 208
From Other Internal and
External Reset Sources
From
ClockDR · AVR_RESET
TDI
D
for a complete description.
Q
TDO
To
Internal Reset
2513K–AVR–07/09

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