STM8S105C4T6TR STMicroelectronics, STM8S105C4T6TR Datasheet - Page 103
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STM8S105C4T6TR
Manufacturer Part Number
STM8S105C4T6TR
Description
MCU 16KB FLASH EEPROM 48-LQFP
Manufacturer
STMicroelectronics
Series
STM8Sr
Datasheet
1.STM8S105C4T6.pdf
(127 pages)
Specifications of STM8S105C4T6TR
Core Processor
STM8
Core Size
8-Bit
Speed
16MHz
Connectivity
I²C, IrDA, LIN, SPI, UART/USART
Peripherals
Brown-out Detect/Reset, POR, PWM, WDT
Number Of I /o
38
Program Memory Size
16KB (16K x 8)
Program Memory Type
FLASH
Eeprom Size
1K x 8
Ram Size
2K x 8
Voltage - Supply (vcc/vdd)
2.95 V ~ 5.5 V
Data Converters
A/D 10x10b
Oscillator Type
Internal
Operating Temperature
-40°C ~ 85°C
Package / Case
48-LQFP
Processor Series
STM8S10x
Core
STM8
Data Bus Width
8 bit
Data Ram Size
2 KB
Interface Type
I2C, SPI, UART
Maximum Clock Frequency
16 MHz
Number Of Programmable I/os
38
Number Of Timers
9
Maximum Operating Temperature
+ 85 C
Mounting Style
SMD/SMT
3rd Party Development Tools
EWSTM8
Development Tools By Supplier
STICE-SYS001
Minimum Operating Temperature
- 40 C
On-chip Adc
10 bit, 10 Channel
For Use With
497-10040 - EVAL KIT STM8S DISCOVERY497-10593 - KIT STARTER FOR STM8S207/8 SER
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Available stocks
Company
Part Number
Manufacturer
Quantity
Price
Company:
Part Number:
STM8S105C4T6TR
Manufacturer:
STMicroelectronics
Quantity:
10 000
Part Number:
STM8S105C4T6TR
Manufacturer:
ST
Quantity:
20 000
STM8S105xx
10.3.12.5
10.3.12.6
Electrostatic discharge (ESD)
Electrostatic discharges (3 positive then 3 negative pulses separated by 1 second) are applied
to the pins of each sample according to each pin combination. The sample size depends on
the number of supply pins in the device (3 parts*(n+1) supply pin). This test conforms to the
JESD22-A114A/A115A standard. For more details, refer to the application note AN1181.
Static latch-up
Two complementary static tests are required on 10 parts to assess the latch-up performance:
•
•
This test conforms to the EIA/JESD 78 IC latch-up standard. For more details, refer to the
application note AN1181.
Symbol
Symbol
V
V
(1)
LU
(1)
are higher than the JEDEC specifications, that means when a device belongs to class A it
exceeds the JEDEC standard. B class strictly covers all the JEDEC criteria (international
standard).
ESD(HBM)
ESD(CDM)
A supply overvoltage (applied to each power supply pin)
A current injection (applied to each input, output and configurable I/O pin) are performed
on each sample.
Data based on characterization results, not tested in production
Class description: A Class is an STMicroelectronics internal specification. All its limits
Parameter
Static latch-up class
Ratings
Electrostatic discharge
voltage (Human body model)
Electrostatic discharge
voltage (Charge device
model)
Table 50: ESD absolute maximum ratings
Table 51: Electrical sensitivities
DocID14771 Rev 10
Conditions
T
T
T
A
A
A
= +25 °C
= +85 °C
= +125 °C
Conditions
T
conforming to
JESD22-A114
T
to JESD22-C101
A
A
=+25°C, conforming
= +25°C,
Electrical characteristics
Class
A
IV
Maximum
value
2000
1000
Class
A
A
A
(1)
(1)
103/127
Unit
V
V