STR911FM42X6 STMicroelectronics, STR911FM42X6 Datasheet - Page 54

• Manufacturer Part Number: STR911FM42X6
• Description: MCU 256K FLASH 96K SRA, USB CAM
• Manufacturer: STMicroelectronics
• Series: STR9r

Specifications of STR911FM42X6

• Core Processor: ARM9
• Core Size: 32-Bit
• Speed: 96MHz
• Connectivity: CAN, I²C, Microwire, SPI, SSP, UART/USART, USB
• Peripherals: Brown-out Detect/Reset, DMA, Motor Control PWM, POR, PWM, WDT
• Number Of I /o: 40
• Program Memory Size: 256KB (256K x 8)
• Program Memory Type: FLASH
• Ram Size: 96K x 8
• Voltage - Supply (vcc/vdd): 1.65 V ~ 2 V
• Data Converters: A/D 8x10b
• Oscillator Type: Internal
• Operating Temperature: -40°C ~ 85°C
• Package / Case: 80-LQFP
• For Use With: MCBSTR9UME - BOARD EVAL MCBSTR9 + ULINK-MEMCBSTR9U - BOARD EVAL MCBSTR9 + ULINK2MCBSTR9 - BOARD EVAL STM STR9 SERIES
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant
• Eeprom Size: -
• Other names: 497-5060; 497-5060-2; 497-5060-2; STR911FM42X6T

Electrical characteristics
6.11
6.11.1 Functional EMS (Electro Magnetic Susceptibility)
6.11.2 Electro Magnetic Interference (EMI)
Notes:
1. Data based on characterization results, not tested in production.
2. BGA and LQFP devices have similar EMI characteristics.
54/73
EMC characteristics
Susceptibility tests are performed on a sample basis during product characterization.
Based on a simple running application on the product (toggling 2 LEDs through I/O ports), the
product is stressed by two electro magnetic events until a failure occurs (indicated by the
LEDs).
●
●
A device reset allows normal operations to be resumed.
Table 17.
1. Data based on characterization results, not tested in production.
Based on a simple application running on the product (toggling 2 LEDs through the I/O ports),
the product is monitored in terms of emission. This emission test is in line with the norm SAE J
1752/3 which specifies the board and the loading of each pin.
Table 18.
Symbol
Symbol
V
V
FESD
S
FFTB
EMI
ESD: Electro-Static Discharge (positive and negative) is applied on all pins of the device
until a functional disturbance occurs. This test conforms with the IEC 1000-4-2 standard.
FTB: A Burst of Fast Transient voltage (positive and negative) is applied to V
V
with the IEC 1000-4-4 standard.
SS
through a 100pF capacitor, until a functional disturbance occurs. This test conforms
Voltage limits to be applied on
any I/O pin to induce a functional
disturbance
Fast transient voltage burst limits
to be applied through 100pF on
V
functional disturbance
DD
Peak level
EMS data
EMI data
Parameter
and V
DDQ
Parameter
pins to induce a
V
T
LQFP128 package
conforming to SAE J
1752/3
A
DDQ
=+25°C,
=3.3V, V
Conditions
DD
V
T
MHz/96MHz PLL
V
T
MHz/96 MHz PLL
conforms to IEC 1000-4-4
=1.8V,
A
A
DD
DD
=+25°C, f
=+25°C, f
=1.8V, V
=1.8V, V
0.1MHz to 30 MHz
30 MHz to 130 MHz
130 MHz to 1GHz
SAE EMI Level
Frequency Band
Conditions
OSC
OSC
DDQ
DDQ
Monitored
/f
/f
=3.3V,
=3.3V,
CPUCLK
CPUCLK
=4
=4
4 MHz/ 96 MHz
[f
OSC
Neg.
-1
-4
Max vs.
(1)
(1)
/f
10
10
22
CPUCLK
4
DD,
Pos.
>2
4
(1)
(1)
STR91xF
V
]
DDQ
Unit
dBµV
Unit
kV
and
-