CNB10112 Panasonic - SSG, CNB10112 Datasheet - Page 11

• Manufacturer Part Number: CNB10112
• Description: SENSOR OPTO TRANS 1MM REFL SMD
• Manufacturer: Panasonic - SSG

Specifications of CNB10112

• Sensing Distance: 0.039" (1mm)
• Sensing Method: Reflective
• Voltage - Collector Emitter Breakdown (max): 35V
• Current - Collector (ic) (max): 20mA
• Current - Dc Forward (if): 30mA
• Output Type: Phototransistor
• Mounting Type: Surface Mount
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant
• Package / Case: -
• Response Time: -
• Other names: CNB10112TR

製品規格／Product Specification
信頼性保証基準／Reliability Guarantee Criterion
故障判定基準／Failure Criterion
品種名／Type Number：ＣＮＢ１０１１２
信頼性保証基準は、(MIL-STD-19500H LTPD:15 %)です。／
Reliability Guarantee Criterion（MIL-STD-19500H LTPD 15 %）
故障判定基準／Failure Criterion
実用動作試験／Operating Test
高温高湿動作試験／Temperature
Humidity Operating Test
高温ﾊﾞｲｱｽ(BT)試験／High Temperature
Bias Operating Life Test
高温高湿ﾊﾞｲｱｽ(THB)試験／Temperature
Humidity Bias Operating Life Test
高温高湿保存試験／High Temperature
Humidity Storage Life Test
高温保存試験／High Temperature
Storage Life Test
低温保存試験／Low Temperature
Storage Life Test
熱衝撃試験／Thermal Shock Test
温度サイクル試験／
Temperature Cycle Test
手はんだ耐熱試験／
Iron Soldering Heat Resistance Test
はんだ付け性試験／
Solderability Test
落下試験／Drop Test
リ−ド線引張り試験／
Terminal Strength Test
リ−ド線折曲げ試験／
Terminal Bend Test
コレクタ出力電流変化率／Collector Current
暗電流／Collector to Emitter Dark Current
順方向電圧／Forward Voltage
外
錆・変色
はんだ付性／Solderability
2005-02-02
Established
観／Appearance
／Rusting, Discoloring
項
項
目／Item
目/Item
(注)(Note) U:初期規格上限値／Upper initial standard
Revised
電気的特性／Electrical Characteristic
外 観 , 他／Appearance, etc
外形規格に準ずる／According to visual spec
錆・変色(ﾘ-ﾄﾞ部)なきこと／
No rusting, discoloring (Lead)
浸漬部分に 95 %以上はんだが付く事
The Solder must stick to steeped part more than 95 % of the face area.
Ta=65 ℃,I
Ta=60 ℃,RH=90 %, I
Ta=85 ℃,V
Ta=60 ℃,RH=90 %, V
Ta=60 ℃,RH=90 %,t=1 000 h
Ta=100 ℃,t=1 000 h
Ta=-40 ℃,t=1 000 h
Ta = 100 ℃ ∼ -40 ℃ , 10 Cycle
Ta = 100 ℃ ∼ 25 ℃ ∼ -40 ℃ , 20 Cycle
SheetNo.5/14 の条件で 1 回通し
SheetNo.5/14 Less than 1 time.
前 処 理:Ta=85 ℃,RH=85 %,t=16 h
試験温度:230 ℃,5 秒,ﾌﾗｯｸｽあり
Solder
高さ 1 m より厚さ 3 cm 以上の楓板上自然落下 3 回
Distance of dropping : 1 m
Drop the device on the maple board 3 times
静荷重 3 N,30 秒間
Weight due to the terminal:3 N,t=30 s
静荷重 1 N,90 度折曲げ,2 回
Weight due to the terminal:1 N, Bend the
terminal at right 90 angle to back, 2 times
(5 min)
(30 min)
:230 ℃,t=5 s with flux
記
Symbol
F
=14 mA, Vcc=10 V, t=1 000 h
CC
Semiconductor Company, Matsushita Electric Industrial Co.,Ltd.
⊿I
I
V
CEO
=28 V, t=1 000 h
条
F
C
号
(5 min)
(5 min)
件／Test Conditions
F
=16 mA, t=500 h
CC
下限/Lower Limit
=28 V, t=500 h
判定基準(注)/Criterion(Note)
(30 min)
50
−
−
上限/Upper Limit
U×2.0
U×1.2
150
結果/Result
Sheet № 11/14
0/15
0/15
0/15
0/15
0/15
0/15
0/15
0/15
0/15
0/15
0/15
0/15
0/15
0/15
単位
Unit
nA
V
%