GNM1M2R71C104MA03D Murata Electronics North America, GNM1M2R71C104MA03D Datasheet - Page 200
GNM1M2R71C104MA03D
Manufacturer Part Number
GNM1M2R71C104MA03D
Description
CAP 2-ARRAY 0.1UF 16V X7R SMD
Manufacturer
Murata Electronics North America
Datasheet
1.GNM1M2R71C104MA03D.pdf
(220 pages)
Specifications of GNM1M2R71C104MA03D
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
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!Note
• This PDF catalog is downloaded from the website of Murata Manufacturing co., ltd. Therefore, it’s specifications are subject to change or our products in it may be discontinued without advance notice. Please check with our
• This PDF catalog has only typical specifications because there is no space for detailed specifications. Therefore, please approve our product specifications or transact the approval sheet for product specifications before ordering.
sales representatives or product engineers before ordering.
!Note
*1 "Room condition" Temperature: 15 to 35D, Relative humidity: 45 to 75%, Atmospheric pressure: 86 to 106kPa
*2 "C" expresses nominal capacitance value (pF).
198
No.
16
17
18
GA3 Series Specifications and Test Methods
Continued from the preceding page.
Temperature
Cycle
Humidity
(Steady
Life
State)
• Please read rating and !CAUTION (for storage, operating, rating, soldering, mounting and handling) in this catalog to prevent smoking and/or burning, etc.
• This catalog has only typical specifications because there is no space for detailed specifications. Therefore, please approve our product specifications or transact the approval sheet for product specifications before ordering.
Item
Appearance
Capacitance
Change
D.F.
Q
I.R.
Dielectric
Strength
Appearance
Capacitance
Change
D.F.
Q
I.R.
Dielectric
Strength
Appearance
Capacitance
Change
D.F.
Q
I.R.
Dielectric
Strength
No marking defects
More than 3,000MΩ
In accordance with item No.4
No marking defects
More than 3,000MΩ
In accordance with item No.4
No marking defects
More than 3,000MΩ
In accordance with item No.4
Char.
Char.
Char.
Char.
Char.
Char.
X7R
X7R
X7R
X7R
X7R
X7R
SL
SL
SL
SL
SL
SL
Within T2.5% or T0.25pF
(Whichever is larger)
Within T5.0% or T0.5pF
(Whichever is larger)
Within T3.0% or T0.3pF
(Whichever is larger)
QU275W5/2C*
QU275W5/2C*
QU350
QU1000
QU350
QU400W20C*
Capacitance Change
Capacitance Change
Capacitance Change
Specification
Specification
Specification
Within T15%
Within T15%
Within T20%
D.F.V0.05
D.F.V0.05
D.F.V0.05
Specifications
2
2
2
(CF30pF)
(CU30pF)
(CU30pF)
(CF30pF)
(CF30pF)
(CU30pF)
Fix the capacitor to the supporting jig (glass epoxy board) shown
in Fig. 4.
Perform the 5 cycles according to the 4 heat treatments listed in
the following table.
Let sit for 24T2 hrs. at room condition*
#Pretreatment for X7R char.
Before this test, the test shown in the following is performed.
·Item 11 Adhesive Strength of Termination (applied force is 5N)
·Item 13 Deflection
Let the capacitor sit at 40T2D and relative humidity of 90 to 95%
for 500
Remove and let sit for 24T2 hrs. at room condition*
measure.
#Pretreatment for X7R char.
Before this test, the test shown in the following is performed.
·Item 11 Adhesive Strength of Termination (apply force is 5N)
·Item 13 Deflection
Impulse Voltage
Each individual capacitor should
be subjected to a 2.5kV (Type
GC/GF: 5kV) Impulse (the
voltage value means zero to
peak) for three times. Then the
capacitors are applied to life test.
Apply voltage as Table for 1,000 hrs. at 125
humidity 50% max.
Let sit for 24T2 hrs. at room condition*
#Pretreatment for X7R char.
Perform a heat treatment at 150
let sit for 24T2 hrs. at room condition*
Perform a heat treatment at 150
let sit for 24T2 hrs. at room condition*
Perform a heat treatment at 150
let sit for 24T2 hrs. at room condition*
Type
GB
GC
GD
GF
Step
W24
Y00
1
2
3
4
AC312.5V (r.m.s.), except that once each hour the
voltage is increased to AC1,000V (r.m.s.) for 0.1 sec.
AC425V (r.m.s.), except that once each hour the
voltage is increased to AC1,000V (r.m.s.) for 0.1 sec.
hrs.
Max. Operating Temp.T2
Min. Operating Temp.T3
Glass Epoxy Board
Temperature (D)
Room Temp.
Room Temp.
Fig. 4
Test Method
Applied Voltage
Continued on the following page.
W00
Y10
W00
Y10
W00
Y10
D for 60T5 min. and then
D for 60T5 min. and then
100
D for 60T5 min. and then
1
0
1
1
1
1
Front time (T
Time to half-value (T
90
50
30
, then measure.
, then measure.
.
.
.
Solder resist
Cu
(%)
T
T
1
W2
Y0
T
2
Time (min.)
D, relative
1
)=1.2 s=1.67T
2 to 3
2 to 3
30T3
30T3
1
, then
2
)=50 s
t
C02E.pdf
09.9.18
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