LP2996M National Semiconductor, LP2996M Datasheet - Page 4
![IC, REG DDR TERMINATION, SMD, SO-8](/photos/18/98/189854/ge8so805-40_sml.jpg)
LP2996M
Manufacturer Part Number
LP2996M
Description
IC, REG DDR TERMINATION, SMD, SO-8
Manufacturer
National Semiconductor
Datasheet
1.LP2996M.pdf
(18 pages)
Specifications of LP2996M
Primary Input Voltage
2.5V
Output Voltage
1.35V
No. Of Pins
8
Output Current
1.5A
Voltage Regulator Case Style
SOIC
Operating Temperature Range
0°C To +125°C
Svhc
No SVHC (15-Dec-2010)
Output Voltage Fixed
1.35V
Rohs Compliant
Yes
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
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Note 1: Absolute maximum ratings indicate limits beyond which damage to the device may occur. Operating range indicates conditions for which the device is
intended to be functional, but does not guarantee specific performance limits. For guaranteed specifications and test conditions see Electrical Characteristics.
The guaranteed specifications apply only for the test conditions listed. Some performance characteristics may degrade when the device is not operated under
the listed test conditions.
Note 2: VDDQ voltage must be less than 2 x (AVIN - 1) or 6V, whichever is smaller.
Note 3: The human body model is a 100pF capacitor discharged through a 1.5kΩ resistor into each pin.
Note 4: At elevated temperatures, devices must be derated based on thermal resistance. The device in the SO-8 package must be derated at θ
= 151.2° C/W
JA
junction to ambient with no heat sink.
Note 5: Limits are 100% production tested at 25°C. Limits over the operating temperature range are guaranteed through correlation using Statistical Quality
Control (SQC) methods. The limits are used to calculate National's Average Outgoing Quality Level (AOQL).
Note 6: VIN is defined as VIN = AVIN = PVIN.
Note 7: Quiescent current defined as the current flow into AVIN.
, the junction to ambient thermal resistance, θ
Note 8: The maximum allowable power dissipation is a function of the maximum junction temperature, T
,
J(MAX)
JA
and the ambient temperature, T
. Exceeding the maximum allowable power dissipation will cause excessive die temperature and the regulator will go into thermal
A
shutdown.
Note 9: V
load regulation is tested by using a 10 ms current pulse and measuring V
.
TT
TT
www.national.com
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