MCP111-240E/TO Microchip Technology, MCP111-240E/TO Datasheet - Page 12
![IC,VOLT DETECTOR,FIXED,+2.32V,SIP,3PIN,PLASTIC](/photos/7/50/75004/to-92_pkg_sml.jpg)
MCP111-240E/TO
Manufacturer Part Number
MCP111-240E/TO
Description
IC,VOLT DETECTOR,FIXED,+2.32V,SIP,3PIN,PLASTIC
Manufacturer
Microchip Technology
Type
Simple Reset/Power-On Resetr
Specifications of MCP111-240E/TO
Rohs Compliant
YES
Number Of Voltages Monitored
1
Output
Open Drain or Open Collector
Reset
Active Low
Voltage - Threshold
2.32V
Operating Temperature
-40°C ~ 125°C
Mounting Type
Through Hole
Package / Case
TO-92-3 (Standard Body), TO-226
Monitored Voltage
2.32 V
Manual Reset
Not Resettable
Watchdog
No Watchdog
Supply Voltage (max)
5.5 V
Supply Voltage (min)
1 V
Supply Current (typ)
1.75 uA
Maximum Operating Temperature
+ 125 C
Mounting Style
Through Hole
Minimum Operating Temperature
- 40 C
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Reset Timeout
-
Lead Free Status / Rohs Status
Lead free / RoHS Compliant
MCP111/112
4.2
The minimum pulse width (time) required to cause a
reset may be an important criteria in the implementa-
tion of a POR circuit. This time is referred to as
transient duration and is the amount of time needed for
these supervisory devices to respond to a drop in V
The transient duration time is dependant on the magni-
tude of V
duration decreases with increases in V
Figure 4-3 shows a typical transient duration vs. reset
comparator overdrive for which the MCP111/112 will
not generate a reset pulse. It shows that the farther
below the trip point the transient pulse goes, the
duration of the pulse required to cause a reset gets
shorter. Figure 2-18 shows the transient response
characteristics for the MCP111/112.
A 0.1 µF bypass cap mounted as close as possible to
the V
(refer to Figure 4-1).
FIGURE 4-3:
Transient Duration Waveform.
DS21889B-page 12
5V
0V
DD
Negative Going V
TRIP
pin provides additional transient immunity
– V
DD
t
TRANS
. Generally speaking, the transient
Time (µs)
Example of Typical
V
TRIP(MIN)
DD
Transients
- V
TRIP
DD
V
V
– V
TRIP(MAX)
TRIP(MIN)
DD
.
DD
.
4.3
The time-out period (t
device remains in the reset condition. This is affected
by both V
Figures 2-22,
response for different V
Effect of Temperature on Time-out
Period (t
DD
and temperature. The graph shown in
2-23 and
RPU
RPU
DD
2004 Microchip Technology Inc.
)
) determines how long the
values and temperatures.
2-24 show the typical