LM26LVCISD-135/NOPB National Semiconductor, LM26LVCISD-135/NOPB Datasheet - Page 18
![IC TEMP SENS/SWITCH 135C 6LLP](/photos/6/60/66085/pkg_sdb06a_sml.jpg)
LM26LVCISD-135/NOPB
Manufacturer Part Number
LM26LVCISD-135/NOPB
Description
IC TEMP SENS/SWITCH 135C 6LLP
Manufacturer
National Semiconductor
Series
PowerWise®r
Datasheet
1.LM26LVEB.pdf
(20 pages)
Specifications of LM26LVCISD-135/NOPB
Sensing Temperature
135°C Trip Point
Output Type
Active High/Push Pull, Active Low/Open Drain, Voltage
Voltage - Supply
1.6 V ~ 5.5 V
Accuracy
±2.2°C
Package / Case
6-WDFN Exposed Pad
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Other names
LM26LVCISD-135TR
20204718
FIGURE 7. Celsius Temperature Switch
20204760
FIGURE 8. TRIP TEST Digital Output Test Circuit
20204765
The TRIP TEST pin, normally used to check the operation of the OVERTEMP and OVERTEMP pins, may be used to latch the
outputs whenever the temperature exceeds the programmed limit and causes the digital outputs to assert. As shown in the figure,
when OVERTEMP goes high the TRIP TEST input is also pulled high and causes OVERTEMP output to latch high and the
OVERTEMP output to latch low. The latch can be released by either momentarily pulling the TRIP TEST pin low (GND), or by
toggling the power supply to the device. The resistor limits the current out of the OVERTEMP output pin.
FIGURE 9. Latch Circuit using OVERTEMP Output
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