EM-LPC1700-58 EMBEST, EM-LPC1700-58 Datasheet - Page 11

• Manufacturer Part Number: EM-LPC1700-58
• Description: NXP LPC1758 Evaluation Board
• Manufacturer: EMBEST

Specifications of EM-LPC1700-58

• Silicon Manufacturer: NXP
• Core Architecture: ARM
• Core Sub-architecture: Cortex-M3
• Features: Cortex Debug, Mini SD Card, USB Device/Host/OTG Interface
• Silicon Core Number: LPC17xx
• Silicon Family Name: LPC17xx

2.11 Hardware Testing
3) Set the attribute of COM1:
Bits Per Second: 115200
Data Bits: 8
Parity Check: NO
Stop Bits: 1
Data Flow Control: NO
Testing phenomenon: The hype terminal displays the characters that input by the
keyboard.
Image file: rtc.hex
Location of source code: RTC
Corresponding chip manual: Datasheet\[processor].pdf
(4) RTC Testing
(1) I/O Testing
Image file: Blinky.hex
Location of source code: Blinky
Corresponding chip manual: Datasheet\[processor].pdf
Steps: Download Blinky.hex to the FLASH of MCU
Testing phenomenon: D2-D9 blink in turn
(2) LCD Testing
Image file: LCD_Blinky.hex
Location of source code: LCD
Corresponding chip manual: Datasheet\LCD corresponding\ MR024-9325-51P-B.pdf
Steps: Download LCD_Blinky.hex to the FLASH of MCU
(3) UART Testing
Image file: UART.hex
Location of source code: UART
Corresponding chip manual: Datasheet\[processor].pdf
Steps:
1) Download UART.hex to the FLASH of MCU, connect UART0 to PC through
Cross-serial line.
2) Run “Begin” -> ”Program” -> ”Accessory” ->”Communication” ->” Super terminal”
in PC.
Testing phenomenon: D2-D9 blink, and LCD displays the LOGO and related words of
Embest Co.
31
TCS
P0.5
www.embedinfo.com/en
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