AD5251BRUZ100 Analog Devices Inc, AD5251BRUZ100 Datasheet - Page 8

IC,Digital Potentiometer,CMOS,TSSOP,14PIN,PLASTIC

AD5251BRUZ100

Manufacturer Part Number
AD5251BRUZ100
Description
IC,Digital Potentiometer,CMOS,TSSOP,14PIN,PLASTIC
Manufacturer
Analog Devices Inc
Datasheet

Specifications of AD5251BRUZ100

Taps
64
Resistance (ohms)
100K
Number Of Circuits
2
Temperature Coefficient
650 ppm/°C Typical
Memory Type
Non-Volatile
Interface
I²C, 2-Wire Serial
Voltage - Supply
2.7 V ~ 5.5 V, ±2.25 V ~ 2.75 V
Operating Temperature
-40°C ~ 85°C
Mounting Type
Surface Mount
Package / Case
14-TSSOP
Resistance In Ohms
100K
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
AD5251/AD5252
ABSOLUTE MAXIMUM RATINGS
T
Table 4.
Parameter
V
V
V
V
Maximum Current
Digital Inputs and Output Voltage to GND
Operating Temperature Range
Maximum Junction Temperature (T
Storage Temperature Range
Lead Temperature (Soldering, 10 sec)
Vapor Phase (60 sec)
Infrared (15 sec)
TSSOP-14 Thermal Resistance
1
2
Maximum terminal current is bound by the maximum applied voltage across
any two of the A, B, and W terminals at a given resistance, the maximum
current handling of the switches, and the maximum power dissipation of the
package. V
Package power dissipation = (T
DD
SS
DD
A
A
, V
I
I
I
I
= 25°C, unless otherwise noted.
WB
WB
WA
AB
to GND
to GND
to V
B
(R
, I
, V
Continuous
Continuous (R
Continuous (R
WA
AB
W
SS
to GND
Pulsed
= 1 kΩ/10 kΩ/50 kΩ/100 kΩ)
DD
= 5 V.
WB
WA
≤ 1 kΩ, A Open)
≤ 1 kΩ, B Open)
JMAX
2
− T
θ
JA
A
)/θ
JMAX
JA
.
1
1
1
)
Rating
−0.3 V, +7 V
+0.3 V, −7 V
7 V
V
±20 mA
±5 mA
±5 mA
±5 mA/±500 μA/
±100 μA/±50 μA
0 V, 7 V
−40°C to +85°C
150°C
−65°C to +150°C
300°C
215°C
220°C
136°C/W
SS
, V
DD
Rev. B | Page 8 of 28
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.
ESD CAUTION

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