ADE7769AR-RL Analog Devices Inc, ADE7769AR-RL Datasheet - Page 5

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ADE7769AR-RL

Manufacturer Part Number
ADE7769AR-RL
Description
IC,Power Metering,CMOS,SOP,16PIN,PLASTIC
Manufacturer
Analog Devices Inc
Datasheet

Specifications of ADE7769AR-RL

Input Impedance
320 KOhm
Measurement Error
0.1%
Voltage - I/o High
2.4V
Voltage - I/o Low
0.8V
Current - Supply
5mA
Voltage - Supply
4.75 V ~ 5.25 V
Operating Temperature
-40°C ~ 85°C
Mounting Type
Surface Mount
Package / Case
16-SOIC (0.154", 3.90mm Width)
Meter Type
Single Phase
Lead Free Status / RoHS Status
Contains lead / RoHS non-compliant
ABSOLUTE MAXIMUM RATINGS
T
Table 3.
Parameter
V
V
Analog Input Voltage to AGND,
Reference Input Voltage to AGND
Digital Input Voltage to DGND
Digital Output Voltage to DGND
Operating Temperature Range
Storage Temperature Range
Junction Temperature
16-Lead Plastic SOIC, Power Dissipation
Package Temperature Soldering
1
ESD CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily accumulate on
the human body and test equipment and can discharge without detection. Although this product features
proprietary ESD protection circuitry, permanent damage may occur on devices subjected to high energy
electrostatic discharges. Therefore, proper ESD precautions are recommended to avoid performance degrada-
tion or loss of functionality.
JEDEC 1S standard (2-layer) board data.
DD
DD
A
V1P, V1N, V2P, and V2N
θ
= 25°C, unless otherwise noted.
JA
to AGND
to DGND
Thermal Impedance
1
Value
−0.3 V to +7 V
–0.3 V to +7 V
–6 V to +6 V
–0.3 V to V
–0.3 V to V
–40°C to +85°C
–65°C to +150°C
150°C
350 mW
124.9°C/W
See J-STD-20
–0.3 V to V
DD
DD
DD
+ 0.3 V
+ 0.3 V
+ 0.3 V
Rev. A | Page 5 of 20
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only and functional operation of the device at these or
any other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.
ADE7769

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