ADG902BCP-500RL7 Analog Devices Inc, ADG902BCP-500RL7 Datasheet - Page 4

• Manufacturer Part Number: ADG902BCP-500RL7
• Description: IC,RF SWITCH,SINGLE,SPST,CMOS,LLCC,8PIN,PLASTIC
• Manufacturer: Analog Devices Inc

Specifications of ADG902BCP-500RL7

• Rf Type: General Purpose
• Frequency: 0Hz ~ 2.5GHz
• Features: SPST
• Package / Case: 8-VFDFN, CSP Exposed Pad
• Frequency (max): 2.5GHz
• Insertion Loss (max): 1.25dB
• Number Of Switches: Single
• Pin Count: 8
• Package Type: LFCSP
• Lead Free Status / RoHS Status: Contains lead / RoHS non-compliant
• Lead Free Status / RoHS Status: Contains lead / RoHS non-compliant

ADG901/ADG902
ABSOLUTE MAXIMUM RATINGS
T
Table 2.
Parameter
V
Inputs to GND
Continuous Current
Input Power
Operating Temperature Range
Storage Temperature Range
Junction Temperature
MSOP Package
θ
LFCSP Package
Lead Temperature, Soldering (10 sec)
IR Reflow, Peak Temperature (<20 sec)
ESD
1
ESD CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily accumulate on
the human body and test equipment and can discharge without detection. Although this product features
proprietary ESD protection circuitry, permanent damage may occur on devices subjected to high energy
electrostatic discharges. Therefore, proper ESD precautions are recommended to avoid performance
degradation or loss of functionality.
RF1/RF2 off port inputs to ground: −0.5 V to V
JA
DD
A
Industrial (B Version)
θ
board)
θ
board)
= 25°C, unless otherwise specified.
Thermal Impedance
to GND
JA
JA
Thermal Impedance (2-Layer
Thermal Impedance (4-Layer
DD
– 0.5 V
Rating
−0.5 V to +4 V
−0.5 V to V
V
30 mA
18 dBm
−40°C to +85°C
−65°C to +150°C
150°C
206°C/W
84°C/W
48°C/W
300°C
235°C
1 kV
1
DD
+ 0.3
Rev. B | Page 4 of 16
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.