ADT7516ARQ Analog Devices Inc, ADT7516ARQ Datasheet - Page 24

• Manufacturer Part Number: ADT7516ARQ
• Description: DTS,12-Bit Quad DAC,4 Analog Inputs I.C.
• Manufacturer: Analog Devices Inc

Specifications of ADT7516ARQ

• Rohs Status: RoHS non-compliant
• Function: Temp Monitoring System (Sensor)
• Topology: ADC, Comparator, Multiplexer, Register Bank
• Sensor Type: External & Internal
• Sensing Temperature: -40°C ~ 120°C, External Sensor
• Output Type: I²C™, MICROWIRE™, QSPI™, SPI™
• Output Alarm: No
• Output Fan: No
• Voltage - Supply: 2.7 V ~ 5.5 V
• Operating Temperature: -40°C ~ 120°C
• Mounting Type: Surface Mount
• Package / Case: 16-QSOP
• Lead Free Status / RoHS Status: Contains lead / RoHS non-compliant
• For Use With: EVAL-ADT7516EBZ - BOARD EVALUATION FOR ADT7516
• Lead Free Status / RoHS Status: Contains lead / RoHS non-compliant

ADT7516/ADT7517/ADT7519
AIN Interrupts
The measured results from the AIN inputs are compared with
the AIN V
equal to comparison) limits. An interrupt occurs if the AIN
inputs exceed or equal the limit registers. These voltage limits
are stored in on-chip registers. Note that the limit registers are
8 bits long and the AIN conversion result is 10 bits long. If the
HIGH
Figure 52. Equivalent Analog Input ESD Circuit
(greater than comparison) and V
AIN
4pF
COMPARISONS
READ RESET
WATCHDOG
S/W RESET
LIMIT
100Ω
AIN1 TO AIN4)
REGISTER 2
INTERRUPT
INTERRUPT
(TEMP AND
REGISTER
STATUS
STATUS
(V
Figure 53. ADT7516/ADT7517/ADT7519 Interrupt Structure
DD
)
LOW
(less than or
CONFIGURATION
REGISTER 1
REGISTERS
INTERRUPT
Rev. B | Page 24 of 44
CONTROL
MASK
INTERNAL
TEMP
EXTERNAL
TEMP
V
DIODE
FAULT
AIN1 TO AIN4
voltage limits are not masked out, then any out-of-limit compari-
sons generate flags that are stored in the Interrupt Status 1
register (Address = 0x00) and one or more out-of-limit results
cause the INT/ INT output to pull either high or low depending
on the output polarity setting. It is good design practice to mask
out interrupts for channels that are of no concern to the
application. Figure 53 shows the interrupt structure for the
ADT7516/ ADT7517/ADT7519. It gives a block diagram
representation of how the various measurement channels affect
the INT/ INT pin.
DD
ENABLE BIT
INT/INT
INT/INT
(LATCHED OUTPUT)