ADXRS624BBGZ Analog Devices Inc, ADXRS624BBGZ Datasheet - Page 10

• Manufacturer Part Number: ADXRS624BBGZ
• Description: Rollover Detection Gyro +/- 75
• Manufacturer: Analog Devices Inc

Specifications of ADXRS624BBGZ

• Sensor Case Style: BGA
• No. Of Pins: 32
• Supply Voltage Range: 4.75V To 5.25V
• Operating Temperature Range: -40°C To +105°C

ADXRS624
behavior. Typical ratiometricity error for null, sensitivity, self-
test, and temperature output is outlined in Table 4.
Note that V
Table 4. Ratiometricity Error for Various Parameters
Parameter
ST1
ST2
Null
Sensitivity
V
NULL ADJUSTMENT
The nominal 2.5 V null is for a symmetrical swing range at
RATEOUT (1B, 2A). However, a nonsymmetrical output swing
may be suitable in some applications. Null adjustment is
possible by injecting a suitable current to SUMJ (1C, 2C). Note
that supply disturbances may reflect some null instability.
Digital supply noise should be avoided particularly in this case.
TEMP
Mean
Sigma
Mean
Sigma
Mean
Sigma
Mean
Sigma
Mean
Sigma
RATIO
V
−0.4%
0.6%
−0.4%
0.6%
−0.04%
0.3%
0.03%
0.1%
−0.3%
0.1%
must never be greater than AV
S
= V
RATIO
= 4.75 V
V
−0.3%
0.6%
−0.3%
0.6%
−0.02%
0.2%
0.1%
0.1%
−0.5%
0.1%
S
= V
CC.
RATIO
= 5.25 V
Rev. A | Page 10 of 12
SELF-TEST FUNCTION
The ADXRS624 includes a self-test feature that actuates each of
the sensing structures and associated electronics as if subjected
to angular rate. The self-test feature is activated by standard
logic high levels applied to Input ST1 (5F, 5G), Input ST2 (4F,
4G), or both. ST1 causes the voltage at RATEOUT to change
about −1.9 V, and ST2 causes an opposite change of +1.9 V. The
self-test response follows the viscosity temperature dependence
of the package atmosphere, approximately 0.25%/°C.
Activating both ST1 and ST2 simultaneously is not damaging.
ST1 and ST2 are fairly closely matched (±5%), but actuating
both simultaneously may result in a small apparent null bias
shift proportional to the degree of self-test mismatch.
ST1 and ST2 are activated by applying a voltage of greater than
0.8 × V
by applying a voltage of less than 0.2 × V
ST2 pins. The voltage applied to ST1 and ST2 must never be
greater than AV
CONTINUOUS SELF-TEST
The one-chip integration of the ADXRS624 gives it higher
reliability than is obtainable with any other high volume
manufacturing method. In addition, it is manufactured
under a mature BiMOS process with field-proven reliability.
As an additional failure detection measure, a power-on
self-test can be performed. However, some applications may
warrant continuous self-test while sensing rate. Details
outlining continuous self-test techniques are also available
in the
AN-768
RATIO
to the ST1 and ST2 pins. ST1 and ST2 are deactivated
Application Note.
CC
.
RATIO
to the ST1 and