EVAL-AD5532EBZ Analog Devices Inc, EVAL-AD5532EBZ Datasheet - Page 8

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EVAL-AD5532EBZ

Manufacturer Part Number
EVAL-AD5532EBZ
Description
Evaluation Board I.c.
Manufacturer
Analog Devices Inc
Datasheets

Specifications of EVAL-AD5532EBZ

Number Of Dac's
32
Number Of Bits
14
Outputs And Type
32, Single Ended
Sampling Rate (per Second)
45k
Data Interface
Serial
Settling Time
22µs
Dac Type
Voltage
Voltage Supply Source
Analog and Digital
Operating Temperature
-40°C ~ 85°C
Utilized Ic / Part
AD5532
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
AD5532
ABSOLUTE MAXIMUM RATINGS
T
Table 5.
Parameter
V
V
AV
DV
Digital Inputs to DGND
Digital Outputs to DGND
REF_IN to AGND, DAC_ GND
V
V
OFFS_IN to AGND
OFFS_OUT to AGND
AGND to DGND
Operating Temperature Range
Storage Temperature Range
Junction Temperature (T
74-Lead CSPBGA Package,
Reflow Soldering
Time at Peak Temperature
Max Power Dissipation
Max Continuous Load Current at
T
1
2
3
Transient currents of up to 100 mA do not cause SCR latch-up.
This limit includes load power.
This maximum allowed continuous load current is spread over 8 channels
J
and channels are grouped as follows:
DD
SS
IN
OUT
A
Industrial
θ
Peak Temperature
AD5532ABC-x
AD5532ABCZ-x
= 70°C, per Channel Group
Group 1: Channels 3, 4, 5, 6, 7, 8, 9, 10
Group 2: Channels 14, 16, 18, 20. 21, 24, 25, 26
Group 3: Channels 15, 17, 19, 22, 23, 27, 28, 29
Group 4: Channels 0, 1, 2, 11, 12, 13, 30, 31
CC
CC
to AGND, DAC_GND
= 25°C unless otherwise noted.
to AGND
to AGND
JA
0–31 to AGND
to AGND, DAC_GND
to DGND
Thermal Impedance
1
J
max)
Rating
−0.3 V to +17 V
+0.3 V to −17 V
−0.3 V to +7 V
−0.3 V to +7 V
−0.3 V to DV
−0.3 V to DV
−0.3 V to AV
−0.3 V to AV
V
V
AGND - 0.3 V to AV
−0.3 V to +0.3 V
−40°C to +85°C
−65°C to +150°C
150°C
41°C/W
220°C
260°C
10 sec to 40 sec
(150°C − T
15 mA
SS
SS
− 0.3 V to V
− 0.3 V to V
3
A
)/θ
CC
CC
CC
CC
JA
+ 0.3 V
+ 0.3 V
+ 0.3 V
+ 0.3 V
DD
DD
mW
+ 0.3 V
+ 0.3 V
CC
2
+ 0.3 V
Rev. D | Page 8 of 20
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.
For higher junction temperatures derate as follows:
TJ (°C)
70
90
100
110
125
135
150
ESD CAUTION
Max Continuous Load Current per Group (mA)
15.5
9.025
6.925
5.175
3.425
2.55
1.5

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