EVAL-AD5821AEBZ Analog Devices Inc, EVAL-AD5821AEBZ Datasheet - Page 4

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EVAL-AD5821AEBZ

Manufacturer Part Number
EVAL-AD5821AEBZ
Description
Evaluation Board I.c.
Manufacturer
Analog Devices Inc
Datasheet

Specifications of EVAL-AD5821AEBZ

Number Of Dac's
1
Number Of Bits
10
Outputs And Type
1, Single Ended
Sampling Rate (per Second)
400k
Data Interface
I²C
Settling Time
250µs
Dac Type
Current
Voltage Supply Source
Single
Operating Temperature
-30°C ~ 80°C
Utilized Ic / Part
AD5821A
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
AD5821A
AC SPECIFICATIONS
V
Table 2.
Parameter
Output Current Settling Time
Slew Rate
Major Code Change Glitch
Impulse
Digital Feedthrough
1
2
3
TIMING SPECIFICATIONS
V
Table 3.
Parameter
f
t
t
t
t
t
t
t
t
t
t
t
C
1
2
3
Timing Diagram
SCL
1
2
3
4
5
6
7
8
9
10
11
Temperature range for the B version is −40°C to +85°C.
Guaranteed by design and characterization; not production tested.
See the Terminology section.
Guaranteed by design and characterization; not production tested.
A master device must provide a hold time of at least 300 ns for the SDA signal (referred to the V
C
B
DD
DD
2
B
SDA
SCL
is the total capacitance of one bus line in pF. t
= 2.7 V to 5.5 V, AGND = DGND = 0 V, R
= 2.7 V to 3.6 V. All specifications T
1
t
9
Limit at T
400
2.5
0.6
1.3
0.6
100
0.9
0
0.6
0.6
1.3
300
0
250
300
20 + 0.1 C
400
3
CONDITION
START
B Version
t
4
MIN
B
3
, T
Min
MAX
t
3
B Version
Typ
250
0.3
0.15
0.06
MIN
R
and t
to T
Unit
kHz max
μs min
μs min
μs min
μs min
ns min
μs max
μs min
μs min
μs min
μs min
ns max
ns min
ns max
ns max
ns min
pF max
t
10
1, 2
F
t
L
are measured between 0.3 V
6
Max
MAX
= 25 Ω connected to V
Figure 2. 2-Wire Serial Interface Timing Diagram
, unless otherwise noted.
Unit
μs
mA/μs
nA-sec
nA-sec
Description
SCL clock frequency
SCL cycle time
t
t
t
t
t
t
t
t
t
Can be CMOS driven
t
t
Capacitive load for each bus line
HIGH
LOW
HD, STA
SU, DAT
HD, DAT
SU, STA
SU, STO
BUF
R
F
F
t
, rise time of both SCL and SDA when receiving
, fall time of SDA when receiving
, fall time of both SCL and SDA when transmitting
2
Rev. 0 | Page 4 of 16
, bus free time between a stop condition and a start condition
, SCL low time
, SCL high time
, setup time for repeated start
, start/repeated start condition hold time
, data setup time
, stop condition setup time
, data hold time
Test Conditions/Comments
V
1 LSB change around major carry
DD
t
11
= 3.6 V, R
DD
DD
t
5
and 0.7 V
, unless otherwise noted.
INH MIN
L
of the SCL signal) to bridge the undefined region of the SCL falling edge.
= 25 Ω, L
DD
.
CONDITION
REPEATED
L
= 680 μH, ¼ scale to ¾ scale change (0x100 to 0x300)
START
t
7
t
4
t
1
CONDITION
STOP
t
8

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