FDS8958A Fairchild Semiconductor, FDS8958A Datasheet - Page 2

• Manufacturer Part Number: FDS8958A
• Description: MOSFET N/P-CH DUAL 30V 8SOIC
• Manufacturer: Fairchild Semiconductor
• Series: PowerTrench®r
• Type: Power MOSFETr

Specifications of FDS8958A

• Fet Type: N and P-Channel
• Fet Feature: Logic Level Gate
• Rds On (max) @ Id, Vgs: 28 mOhm @ 7A, 10V
• Drain To Source Voltage (vdss): 30V
• Current - Continuous Drain (id) @ 25° C: 7A, 5A
• Vgs(th) (max) @ Id: 3V @ 250µA
• Gate Charge (qg) @ Vgs: 16nC @ 10V
• Input Capacitance (ciss) @ Vds: 575pF @ 15V
• Power - Max: 900mW
• Mounting Type: Surface Mount
• Package / Case: 8-SOIC (3.9mm Width)
• Configuration: Dual Dual Drain
• Transistor Polarity: N and P-Channel
• Resistance Drain-source Rds (on): 0.028 Ohms / 0.052 Ohms
• Forward Transconductance Gfs (max / Min): 25 S, 10 S
• Drain-source Breakdown Voltage: +/- 30 V
• Gate-source Breakdown Voltage: +/- 20 V
• Continuous Drain Current: + 7 A / - 5 A
• Power Dissipation: 2 W
• Maximum Operating Temperature: + 150 C
• Mounting Style: SMD/SMT
• Minimum Operating Temperature: - 55 C
• Number Of Elements: 2
• Polarity: N/P
• Channel Mode: Enhancement
• Drain-source On-volt: 30V
• Gate-source Voltage (max): ±20V
• Operating Temp Range: -55C to 150C
• Operating Temperature Classification: Military
• Mounting: Surface Mount
• Pin Count: 8
• Package Type: SOIC N
• Dc: N/A
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant
• Other names: FDS8958ATR; FDS8958A_NL

Lot
Q20070231AAACLV
Q20070231BAACLV
Q20070231CAACLV
Q20070231DAACLV
Test: (High Temperature Gate Bias)
Lot
Q20070231AAHTGB
Q20070231BAHTGB
Q20070231CAHTGB
Q20070231DAHTGB
Test: (High Temperature Reverse Bias)
Lot
Q20070231AAHTRB
Q20070231BAHTRB
Q20070231CAHTRB
Q20070231DAHTRB
Test: (Power Cycle)
Lot
Q20070231AAPRCL
Q20070231AAPRCL
Q20070231BAPRCL
Q20070231BAPRCL
Q20070231CAPRCL
Q20070231CAPRCL
Q20070231DAPRCL
Q20070231DAPRCL
Test: -65C, 150C (Temperature Cycle)
Lot
Q20070231AATMCL1
Q20070231AATMCL1
Q20070231BATMCL1
Q20070231BATMCL1
Q20070231CATMCL1
Q20070231CATMCL1
Q20070231DATMCL1
Q20070231DATMCL1
Test: 130C (Highly Accelerated Stress Test)
Lot
Q20070231AAHAST1
Q20070231BAHAST1
Q20070231CAHAST1
Q20070231DAHAST1
Test: MSL(1), PKG(Small), PeakTemp(260c), Cycles(3) (Precondition)
Lot
Q20070231AAPCNL1A
Q20070231BAPCNL1A
Q20070231CAPCNL1A
Q20070231DAPCNL1A
Device
FDS6912A
FDS3570
FDS3672
FDS8870
Device
FDS6912A
FDS3570
FDS3672
FDS8870
Device
FDS6912A
FDS6912A
FDS3570
FDS3570
FDS3672
FDS3672
FDS8870
FDS8870
Device
FDS6912A
FDS6912A
FDS3570
FDS3570
FDS3672
FDS3672
FDS8870
FDS8870
Device
FDS6912A
FDS3570
FDS3672
FDS8870
Device
FDS6912A
FDS3570
FDS3672
FDS8870
Device
FDS6912A
FDS3570
FDS3672
FDS8870
168-HOURS
0/77
0/77
0/77
0/77
168-HOURS
0/77
0/77
0/77
0/77
5000-CYCLES
0/77
0/77
0/77
0/77
100-CYCLES
0/77
0/77
0/77
0/77
96-HOURS
0/77
0/77
0/77
0/77
500-HOURS
0/77
0/77
0/77
0/77
500-HOURS
0/77
0/77
0/77
0/77
96-HOURS
0/77
0/77
0/77
0/77
Results
0/231
0/231
0/231
0/231
10000-CYCLES
0/77
0/77
0/77
0/77
500-CYCLES
0/77
0/77
0/77
0/77
1000-HOURS
0/77
0/77
0/77
0/77
1000-HOURS
0/77
0/77
0/77
0/77
Failure Code
Failure Code
Failure Code
Failure Code
Failure Code
Failure Code
Failure Code
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