FDW2511NZ Fairchild Semiconductor, FDW2511NZ Datasheet
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FDW2511NZ
Specifications of FDW2511NZ
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FDW2511NZ Summary of contents
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... This notification is for your information and concurrence. This is a preliminary notification. A Final PCN will be issued when qualification is complete and data is available. If you require data or samples to qualify this change, please contact Fairchild Semiconductor within 30 days of receipt of this notification. If you have any questions concerning this change, please contact: ...
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Change To Qualification Stress Test and Sample Size Detail Device #1 FDW2508PB Package: -1 #Leads: -1 Precondition Description: Stress P/C Standard PCNL1A JESD22-A113 Environment Stress Detail: Stress P/C Standard ACLV X JESD22-A102 100%RH, 121C 96 H3TRB X JESD22-A101B85%RH, 85C, HTGB ...
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... FDW2502P FDW2503N_NL FDW2506P_NL FDW2508P FDW2510NZ_NL FDW2512NZ FDW2521C_NL FDW254PZ FDW258P FDW6923 FDW9926NZ SI6466DQ 0 Samples TP3 A 77 1000 77 1000 77 1000 Read- Sample points A 0 Samples TP3 A 77 1000 77 1000 77 1000 FDW2501NZ FDW2503N FDW2504P FDW2507N FDW2508PB FDW2511NZ FDW2520C FDW252P FDW254P_NL FDW2601NZ FDW9926A SI6426DQ SI6933DQ Pg. 3 ...
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SI6955DQ Pg. 4 ...