FDW2503NZ Fairchild Semiconductor, FDW2503NZ Datasheet
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FDW2503NZ
Specifications of FDW2503NZ
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FDW2503NZ Summary of contents
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... This notification is for your information and concurrence. This is a preliminary notification. A Final PCN will be issued when qualification is complete and data is available. If you require data or samples to qualify this change, please contact Fairchild Semiconductor within 30 days of receipt of this notification. If you have any questions concerning this change, please contact: ...
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Change To Qualification Stress Test and Sample Size Detail Device #1 FDW2508PB Package: -1 #Leads: -1 Precondition Description: Stress P/C Standard PCNL1A JESD22-A113 Environment Stress Detail: Stress P/C Standard ACLV X JESD22-A102 100%RH, 121C 96 H3TRB X JESD22-A101B85%RH, 85C, HTGB ...
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... H3TRB X JESD22-A101B85%RH, 85C, HTGB JESD22-A108 150C, 100% of HTRB JESD22-A108 150C, 80% of re- PRCL MIL- STD-750-1036 TMCL1 X JESD22-A104 -65C, 150C Product Id Description : Affected FSIDs : 5ES4_B5E012A FDW2501N_NBDE006A FDW2503NZ FDW2506P FDW2507NZ_NL FDW2508P_NBCP007A FDW2511NZ_NL FDW2521C FDW254P FDW256P FDW262P FDW9926A_NL SI6435DQ Readpoints Conditions TP1 TP2 168 500 ...
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SI6955DQ Pg. 4 ...