FDS6294 Fairchild Semiconductor, FDS6294 Datasheet - Page 2

• Manufacturer Part Number: FDS6294
• Description: MOSFET N-CH 30V 13A 8SOIC
• Manufacturer: Fairchild Semiconductor
• Series: PowerTrench®r

Specifications of FDS6294

• Fet Type: MOSFET N-Channel, Metal Oxide
• Fet Feature: Logic Level Gate
• Rds On (max) @ Id, Vgs: 11.3 mOhm @ 13A, 10V
• Drain To Source Voltage (vdss): 30V
• Current - Continuous Drain (id) @ 25° C: 13A
• Vgs(th) (max) @ Id: 3V @ 250µA
• Gate Charge (qg) @ Vgs: 14nC @ 5V
• Input Capacitance (ciss) @ Vds: 1205pF @ 15V
• Power - Max: 1.2W
• Mounting Type: Surface Mount
• Package / Case: 8-SOIC (3.9mm Width)
• Configuration: Single Quad Drain Triple Source
• Transistor Polarity: N-Channel
• Resistance Drain-source Rds (on): 0.0113 Ohm @ 10 V
• Forward Transconductance Gfs (max / Min): 48 S
• Drain-source Breakdown Voltage: 30 V
• Gate-source Breakdown Voltage: +/- 20 V
• Continuous Drain Current: 13 A
• Power Dissipation: 3000 mW
• Maximum Operating Temperature: + 175 C
• Mounting Style: SMD/SMT
• Minimum Operating Temperature: - 55 C
• Continuous Drain Current Id: 13A
• Drain Source Voltage Vds: 30V
• On Resistance Rds(on): 11.3mohm
• Rds(on) Test Voltage Vgs: 10V
• Threshold Voltage Vgs Typ: 1.8V
• Transistor Case Style: SOIC
• Rohs Compliant: Yes
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant
• Other names: FDS6294

Lot
Q20070231AAACLV
Q20070231BAACLV
Q20070231CAACLV
Q20070231DAACLV
Test: (High Temperature Gate Bias)
Lot
Q20070231AAHTGB
Q20070231BAHTGB
Q20070231CAHTGB
Q20070231DAHTGB
Test: (High Temperature Reverse Bias)
Lot
Q20070231AAHTRB
Q20070231BAHTRB
Q20070231CAHTRB
Q20070231DAHTRB
Test: (Power Cycle)
Lot
Q20070231AAPRCL
Q20070231AAPRCL
Q20070231BAPRCL
Q20070231BAPRCL
Q20070231CAPRCL
Q20070231CAPRCL
Q20070231DAPRCL
Q20070231DAPRCL
Test: -65C, 150C (Temperature Cycle)
Lot
Q20070231AATMCL1
Q20070231AATMCL1
Q20070231BATMCL1
Q20070231BATMCL1
Q20070231CATMCL1
Q20070231CATMCL1
Q20070231DATMCL1
Q20070231DATMCL1
Test: 130C (Highly Accelerated Stress Test)
Lot
Q20070231AAHAST1
Q20070231BAHAST1
Q20070231CAHAST1
Q20070231DAHAST1
Test: MSL(1), PKG(Small), PeakTemp(260c), Cycles(3) (Precondition)
Lot
Q20070231AAPCNL1A
Q20070231BAPCNL1A
Q20070231CAPCNL1A
Q20070231DAPCNL1A
Device
FDS6912A
FDS3570
FDS3672
FDS8870
Device
FDS6912A
FDS3570
FDS3672
FDS8870
Device
FDS6912A
FDS6912A
FDS3570
FDS3570
FDS3672
FDS3672
FDS8870
FDS8870
Device
FDS6912A
FDS6912A
FDS3570
FDS3570
FDS3672
FDS3672
FDS8870
FDS8870
Device
FDS6912A
FDS3570
FDS3672
FDS8870
Device
FDS6912A
FDS3570
FDS3672
FDS8870
Device
FDS6912A
FDS3570
FDS3672
FDS8870
168-HOURS
0/77
0/77
0/77
0/77
168-HOURS
0/77
0/77
0/77
0/77
5000-CYCLES
0/77
0/77
0/77
0/77
100-CYCLES
0/77
0/77
0/77
0/77
96-HOURS
0/77
0/77
0/77
0/77
500-HOURS
0/77
0/77
0/77
0/77
500-HOURS
0/77
0/77
0/77
0/77
96-HOURS
0/77
0/77
0/77
0/77
Results
0/231
0/231
0/231
0/231
10000-CYCLES
0/77
0/77
0/77
0/77
500-CYCLES
0/77
0/77
0/77
0/77
1000-HOURS
0/77
0/77
0/77
0/77
1000-HOURS
0/77
0/77
0/77
0/77
Failure Code
Failure Code
Failure Code
Failure Code
Failure Code
Failure Code
Failure Code
Pg. 2