FDS8812NZ Fairchild Semiconductor, FDS8812NZ Datasheet - Page 2

MOSFET N-CH 30V 20A 8-SOIC

FDS8812NZ

Manufacturer Part Number
FDS8812NZ
Description
MOSFET N-CH 30V 20A 8-SOIC
Manufacturer
Fairchild Semiconductor
Series
PowerTrench®r
Datasheet

Specifications of FDS8812NZ

Fet Type
MOSFET N-Channel, Metal Oxide
Fet Feature
Logic Level Gate
Rds On (max) @ Id, Vgs
4 mOhm @ 20A, 10V
Drain To Source Voltage (vdss)
30V
Current - Continuous Drain (id) @ 25° C
20A
Vgs(th) (max) @ Id
3V @ 250µA
Gate Charge (qg) @ Vgs
126nC @ 10V
Input Capacitance (ciss) @ Vds
6925pF @ 15V
Power - Max
1W
Mounting Type
Surface Mount
Package / Case
8-SOIC (3.9mm Width)
Configuration
Single Quad Drain Triple Source
Transistor Polarity
N-Channel
Resistance Drain-source Rds (on)
0.004 Ohm @ 10 V
Forward Transconductance Gfs (max / Min)
87 S
Drain-source Breakdown Voltage
30 V
Gate-source Breakdown Voltage
+/- 20 V
Continuous Drain Current
20 A
Power Dissipation
2500 mW
Maximum Operating Temperature
+ 150 C
Mounting Style
SMD/SMT
Minimum Operating Temperature
- 55 C
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Other names
FDS8812NZTR

Available stocks

Company
Part Number
Manufacturer
Quantity
Price
Part Number:
FDS8812NZ
Manufacturer:
Fairchild Semiconductor
Quantity:
173 789
Part Number:
FDS8812NZ
Manufacturer:
FAIRCHILD/仙童
Quantity:
20 000
Part Number:
FDS8812NZ-NL
Manufacturer:
FAIRCHILD
Quantity:
12 500
Part Number:
FDS8812NZ-NL
Manufacturer:
FAIRCHILD/仙童
Quantity:
20 000
Lot
Q20070231AAACLV
Q20070231BAACLV
Q20070231CAACLV
Q20070231DAACLV
Test: (High Temperature Gate Bias)
Lot
Q20070231AAHTGB
Q20070231BAHTGB
Q20070231CAHTGB
Q20070231DAHTGB
Test: (High Temperature Reverse Bias)
Lot
Q20070231AAHTRB
Q20070231BAHTRB
Q20070231CAHTRB
Q20070231DAHTRB
Test: (Power Cycle)
Lot
Q20070231AAPRCL
Q20070231AAPRCL
Q20070231BAPRCL
Q20070231BAPRCL
Q20070231CAPRCL
Q20070231CAPRCL
Q20070231DAPRCL
Q20070231DAPRCL
Test: -65C, 150C (Temperature Cycle)
Lot
Q20070231AATMCL1
Q20070231AATMCL1
Q20070231BATMCL1
Q20070231BATMCL1
Q20070231CATMCL1
Q20070231CATMCL1
Q20070231DATMCL1
Q20070231DATMCL1
Test: 130C (Highly Accelerated Stress Test)
Lot
Q20070231AAHAST1
Q20070231BAHAST1
Q20070231CAHAST1
Q20070231DAHAST1
Test: MSL(1), PKG(Small), PeakTemp(260c), Cycles(3) (Precondition)
Lot
Q20070231AAPCNL1A
Q20070231BAPCNL1A
Q20070231CAPCNL1A
Q20070231DAPCNL1A
Device
FDS6912A
FDS3570
FDS3672
FDS8870
Device
FDS6912A
FDS3570
FDS3672
FDS8870
Device
FDS6912A
FDS6912A
FDS3570
FDS3570
FDS3672
FDS3672
FDS8870
FDS8870
Device
FDS6912A
FDS6912A
FDS3570
FDS3570
FDS3672
FDS3672
FDS8870
FDS8870
Device
FDS6912A
FDS3570
FDS3672
FDS8870
Device
FDS6912A
FDS3570
FDS3672
FDS8870
Device
FDS6912A
FDS3570
FDS3672
FDS8870
168-HOURS
0/77
0/77
0/77
0/77
168-HOURS
0/77
0/77
0/77
0/77
5000-CYCLES
0/77
0/77
0/77
0/77
100-CYCLES
0/77
0/77
0/77
0/77
96-HOURS
0/77
0/77
0/77
0/77
500-HOURS
0/77
0/77
0/77
0/77
500-HOURS
0/77
0/77
0/77
0/77
96-HOURS
0/77
0/77
0/77
0/77
Results
0/231
0/231
0/231
0/231
10000-CYCLES
0/77
0/77
0/77
0/77
500-CYCLES
0/77
0/77
0/77
0/77
1000-HOURS
0/77
0/77
0/77
0/77
1000-HOURS
0/77
0/77
0/77
0/77
Failure Code
Failure Code
Failure Code
Failure Code
Failure Code
Failure Code
Failure Code
Pg. 2

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