FDC606P Fairchild Semiconductor, FDC606P Datasheet - Page 4

• Manufacturer Part Number: FDC606P
• Description: MOSFET P-CH 12V 6A SSOT-6
• Manufacturer: Fairchild Semiconductor
• Series: PowerTrench®r
• Type: Power MOSFETr

Specifications of FDC606P

• Fet Type: MOSFET P-Channel, Metal Oxide
• Fet Feature: Logic Level Gate
• Rds On (max) @ Id, Vgs: 26 mOhm @ 6A, 4.5V
• Drain To Source Voltage (vdss): 12V
• Current - Continuous Drain (id) @ 25° C: 6A
• Vgs(th) (max) @ Id: 1.5V @ 250µA
• Gate Charge (qg) @ Vgs: 25nC @ 4.5V
• Input Capacitance (ciss) @ Vds: 1699pF @ 6V
• Power - Max: 800mW
• Mounting Type: Surface Mount
• Package / Case: 6-SSOT, SuperSOT-6
• Configuration: Single Quad Drain
• Transistor Polarity: P-Channel
• Resistance Drain-source Rds (on): 0.026 Ohm @ 4.5 V
• Forward Transconductance Gfs (max / Min): 25 S
• Drain-source Breakdown Voltage: 12 V
• Gate-source Breakdown Voltage: +/- 8 V
• Continuous Drain Current: 6 A
• Power Dissipation: 1600 mW
• Maximum Operating Temperature: + 150 C
• Mounting Style: SMD/SMT
• Minimum Operating Temperature: - 55 C
• Number Of Elements: 1
• Polarity: P
• Channel Mode: Enhancement
• Drain-source On-res: 0.026Ohm
• Drain-source On-volt: 12V
• Gate-source Voltage (max): ±8V
• Operating Temp Range: -55C to 150C
• Operating Temperature Classification: Military
• Mounting: Surface Mount
• Pin Count: 6
• Package Type: SuperSOT
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant
• Other names: FDC606P; FDC606PTR

Q20070473BBHTGB
Q20070473BCHTGB
Q20070473CAHTGB
Q20070473FAHTGB
Q20070473FBHTGB
Q20070473GAHTGB
Test: (High Temperature Reverse Bias)
Lot
Q20070473AAHTRB
Q20070473BAHTRB
Q20070473BBHTRB
Q20070473BCHTRB
Q20070473CAHTRB
Q20070473FAHTRB
Q20070473FBHTRB
Q20070473GAHTRB
Test: (Power Cycle)
Lot
Q20070473AAPRCL
Q20070473AAPRCL
Q20070473BAPRCL
Q20070473BAPRCL
Q20070473BBPRCL
Q20070473BBPRCL
Q20070473BCPRCL
Q20070473BCPRCL
Q20070473CAPRCL
Q20070473CAPRCL
Q20070473EAPRCL
Q20070473EAPRCL
Q20070473FAPRCL
Q20070473FAPRCL
Q20070473FBPRCL
Q20070473FBPRCL
Q20070473GAPRCL
Q20070473GAPRCL
Test: (Static Op Life)
Lot
Q20070473DASOPL1
Test: (Temperature Humidity Biased Test)
Lot
FDC658AP
FDN338P
FDN371N
Device
FDC637BNZ
FDC638APZ
FDC658AP
FDN338P
FDN371N
Device
FAN2558SX
Device
Device
FDC637BNZ
FDC637BNZ
FDC638APZ
FDC638APZ
FDC638APZ
FDC638APZ
FDC638APZ
FDC638APZ
FDC658AP
FDC658AP
FDC365P
FDC365P
FDN338P
FDN338P
FDN338P
FDN338P
FDN371N
FDN371N
0/77
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168-HOURS
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168-HOURS
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168-HOURS
5000-CYCLES
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500-HOURS
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500-HOURS
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500-HOURS
10000-CYCLES
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1000-HOURS
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1000-HOURS
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1000-HOURS
Failure Code
Failure Code
Failure Code
Failure Code
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