FDG330P Fairchild Semiconductor, FDG330P Datasheet
FDG330P
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FDG330P Summary of contents
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... This is to inform you that a design and/or process change will be made to the following product(s). This notification is for your information and concurrence. If you require data or samples to qualify this change, please contact Fairchild Semiconductor within 30 days of receipt of this notification. Updated process quality documentation, such as FMEAs and Control Plans, are available for viewing upon request ...
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Change From Change To Pg. 2 ...
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Results/Discussion Test: (Autoclave) Lot Device Q20070416AAACLV FDG313N Q20070416ABACLV FDG313N Q20070416ACACLV FDG313N Q20070416BAACLV FDG6323L Q20070416BBACLV FDG6323L Q20070416BCACLV FDG6323L Q20070416CAACLV FDG361N Q20070416DAACLV NC7WZ17P6X Test: (High Humidity, High Temp, Rev. Bias) Lot Device Q20070416AAH3TRB FDG313N Q20070416ABH3TRB FDG313N Q20070416ACH3TRB FDG313N Test: (High Temperature Gate ...
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Q20070416CAHTGB FDG361N Q20070416CAHTGB FDG361N Test: (High Temperature Reverse Bias) Lot Device Q20070416AAHTRB FDG313N Q20070416AAHTRB FDG313N Q20070416ABHTRB FDG313N Q20070416ABHTRB FDG313N Q20070416ACHTRB FDG313N Q20070416ACHTRB FDG313N Q20070416CAHTRB FDG361N Q20070416CAHTRB FDG361N Test: (Power Cycle) Lot Device Q20070416AAPRCL FDG313N Q20070416AAPRCL FDG313N Q20070416ABPRCL FDG313N Q20070416ABPRCL FDG313N ...
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... Product Id Description : This Final notification covers Fairchild Semiconductor MOSFET devices in SC70-6 package. For complete listing of product covered in this PCN release, please refer to the Affected FSID listing. Affected FSIDs : FDG311N FDG313N FDG314P FDG316P_NL FDG327N FDG328P FDG330P FDG6301N FDG6303N FDG6304P_D87Z FDG6306P_NL FDG6313N FDG6317NZ FDG6318P_NL FDG6321C FDG6322C_D87Z ...