NDS9407 Fairchild Semiconductor, NDS9407 Datasheet - Page 2
![MOSFET P-CH 60V 3A 8-SOIC](/photos/5/42/54236/261-8-soic_sml.jpg)
NDS9407
Manufacturer Part Number
NDS9407
Description
MOSFET P-CH 60V 3A 8-SOIC
Manufacturer
Fairchild Semiconductor
Series
PowerTrench®r
Datasheet
1.NDS9407.pdf
(5 pages)
Specifications of NDS9407
Fet Type
MOSFET P-Channel, Metal Oxide
Fet Feature
Logic Level Gate
Rds On (max) @ Id, Vgs
150 mOhm @ 3A, 10V
Drain To Source Voltage (vdss)
60V
Current - Continuous Drain (id) @ 25° C
3A
Vgs(th) (max) @ Id
3V @ 250µA
Gate Charge (qg) @ Vgs
22nC @ 10V
Input Capacitance (ciss) @ Vds
732pF @ 30V
Power - Max
1W
Mounting Type
Surface Mount
Package / Case
8-SOIC (3.9mm Width)
Configuration
Single Quad Drain Triple Source
Transistor Polarity
P-Channel
Resistance Drain-source Rds (on)
78 m Ohms
Drain-source Breakdown Voltage
- 60 V
Gate-source Breakdown Voltage
+/- 20 V
Continuous Drain Current
- 3 A
Power Dissipation
2.5 W
Maximum Operating Temperature
+ 175 C
Mounting Style
SMD/SMT
Minimum Operating Temperature
- 55 C
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Other names
NDS9407TR
Available stocks
Company
Part Number
Manufacturer
Quantity
Price
Company:
Part Number:
NDS9407
Manufacturer:
FSC
Quantity:
90 000
Company:
Part Number:
NDS9407
Manufacturer:
FSC
Quantity:
2 746
Part Number:
NDS9407
Manufacturer:
FAIRCHILD/仙童
Quantity:
20 000
Part Number:
NDS9407-NL
Manufacturer:
FAIRCHILD/仙童
Quantity:
20 000
Lot
Q20070231AAACLV
Q20070231BAACLV
Q20070231CAACLV
Q20070231DAACLV
Test: (High Temperature Gate Bias)
Lot
Q20070231AAHTGB
Q20070231BAHTGB
Q20070231CAHTGB
Q20070231DAHTGB
Test: (High Temperature Reverse Bias)
Lot
Q20070231AAHTRB
Q20070231BAHTRB
Q20070231CAHTRB
Q20070231DAHTRB
Test: (Power Cycle)
Lot
Q20070231AAPRCL
Q20070231AAPRCL
Q20070231BAPRCL
Q20070231BAPRCL
Q20070231CAPRCL
Q20070231CAPRCL
Q20070231DAPRCL
Q20070231DAPRCL
Test: -65C, 150C (Temperature Cycle)
Lot
Q20070231AATMCL1
Q20070231AATMCL1
Q20070231BATMCL1
Q20070231BATMCL1
Q20070231CATMCL1
Q20070231CATMCL1
Q20070231DATMCL1
Q20070231DATMCL1
Test: 130C (Highly Accelerated Stress Test)
Lot
Q20070231AAHAST1
Q20070231BAHAST1
Q20070231CAHAST1
Q20070231DAHAST1
Test: MSL(1), PKG(Small), PeakTemp(260c), Cycles(3) (Precondition)
Lot
Q20070231AAPCNL1A
Q20070231BAPCNL1A
Q20070231CAPCNL1A
Q20070231DAPCNL1A
Device
FDS6912A
FDS3570
FDS3672
FDS8870
Device
FDS6912A
FDS3570
FDS3672
FDS8870
Device
FDS6912A
FDS6912A
FDS3570
FDS3570
FDS3672
FDS3672
FDS8870
FDS8870
Device
FDS6912A
FDS6912A
FDS3570
FDS3570
FDS3672
FDS3672
FDS8870
FDS8870
Device
FDS6912A
FDS3570
FDS3672
FDS8870
Device
FDS6912A
FDS3570
FDS3672
FDS8870
Device
FDS6912A
FDS3570
FDS3672
FDS8870
168-HOURS
0/77
0/77
0/77
0/77
168-HOURS
0/77
0/77
0/77
0/77
5000-CYCLES
0/77
0/77
0/77
0/77
100-CYCLES
0/77
0/77
0/77
0/77
96-HOURS
0/77
0/77
0/77
0/77
500-HOURS
0/77
0/77
0/77
0/77
500-HOURS
0/77
0/77
0/77
0/77
96-HOURS
0/77
0/77
0/77
0/77
Results
0/231
0/231
0/231
0/231
10000-CYCLES
0/77
0/77
0/77
0/77
500-CYCLES
0/77
0/77
0/77
0/77
1000-HOURS
0/77
0/77
0/77
0/77
1000-HOURS
0/77
0/77
0/77
0/77
Failure Code
Failure Code
Failure Code
Failure Code
Failure Code
Failure Code
Failure Code
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