FQP6N50C Fairchild Semiconductor, FQP6N50C Datasheet

FQP6N50C

Manufacturer Part Number

FQP6N50C

Description

MOSFET N-CH 500V 5.5A TO-220

Manufacturer

Fairchild Semiconductor

Series

QFET™r

Datasheet

1.FQP6N50C.pdf (9 pages)

Specifications of FQP6N50C

Fet Type

MOSFET N-Channel, Metal Oxide

Fet Feature

Standard

Rds On (max) @ Id, Vgs

1.2 Ohm @ 2.8A, 10V

Drain To Source Voltage (vdss)

500V

Current - Continuous Drain (id) @ 25° C

5.5A

Vgs(th) (max) @ Id

4V @ 250µA

Gate Charge (qg) @ Vgs

25nC @ 10V

Input Capacitance (ciss) @ Vds

700pF @ 25V

Power - Max

98W

Mounting Type

Through Hole

Package / Case

TO-220-3 (Straight Leads)

Lead Free Status / RoHS Status

Lead free / RoHS Compliant

Available stocks

Company

Part Number

Manufacturer

Quantity

Price

Company:

Bonase Electronics (HK) Co., Limited

Part Number:

FQP6N50C

Manufacturer:

Fairchild Semiconductor

Quantity:

135

Company:

Bonase Electronics (HK) Co., Limited

Part Number:

FQP6N50C

Manufacturer:

FAIRCHILD

Quantity:

12 500

Company:

Bonase Electronics (HK) Co., Limited

Part Number:

FQP6N50C

Manufacturer:

FSC

Quantity:

86 755

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This is to inform you that a design and/or process change will be made to the following

product(s). This notification is for your information and concurrence.

If you require data or samples to qualify this change, please contact Fairchild Semiconductor

within 30 days of receipt of this notification.

Updated process quality documentation, such as FMEAs and Control Plans, are available for

viewing upon request.

If you have any questions concerning this change, please contact:

PCN Originator:

Name: LEE, JEONGSOO

E-mail: JEONGSOO.LEE@fairchildsemi.com

Phone: 82-32-680-1311

Implementation of change:

Expected 1st Device Shipment Date: 2008/08/10

Earliest Year/Work Week of Changed Product: WW33

Change Type Description: Passivation Material, Fab Process Change

Description of Change (From): There is no passivation layer.

Description of Change (To): Adding Passivation layer on front metal.

Reason for Change : To improve product quality.

Qual/REL Plan Numbers : Q20070212

Qualification :

All items were passed.

Results/Discussion

Test: (Autoclave)

Lot

Q20070212AAACLV

Q20070212ABACLV

Q20070212ACACLV

Test: (High Temperature Gate Bias)

Lot

Q20070212AAHTGB

Q20070212ABHTGB

Q20070212ACHTGB

DESIGN/PROCESS CHANGE NOTIFICATION -- FINAL

Technical Contact:

Name: LEE, JEONGSOO

E-mail: JEONGSOO.LEE@fairchildsemi.com

Phone: 82-32-680-1311

Device

FQPF6N90C

Device

FQPF6N90C

500-HOURS

0/77

96-HOURS

0/77

1000-HOURS

0/77

Date Issued On : 2008/05/14

Date Created : 2008/05/09

Failure Code

PCN# : Q2081907

Pg. 1

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FQP6N50C Summary of contents

Page 1

... This is to inform you that a design and/or process change will be made to the following product(s). This notification is for your information and concurrence. If you require data or samples to qualify this change, please contact Fairchild Semiconductor within 30 days of receipt of this notification. Updated process quality documentation, such as FMEAs and Control Plans, are available for viewing upon request ...

Page 2

... FQB12N60CTM FQB5N50CTM FQD2N60CTF FQD2N60CTM_WS FQD3N50CTM_F101 FQD3N60CTM_WS FQD5N50CTM FQD5N50CTM_WS FQD6N50CTM_F105 FQI5N50CTU FQP12N60C_F080 FQP13N50C_F105 FQP3N50C FQP5N50C FQP6N50C FQPF12N60C FQPF13N50CSDTU FQPF13N50C_TC003 FQPF3N50C FQPF9N50C FQU2N60CTU FQU5N50CTU Failure Code 1000-HOURS Failure Code 0/77 0/77 0/77 Failure Code FQB13N50CTM FQB9N50CTM FQD2N60CTF_F105 FQD3N50CTF ...

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