LX1701SPK EVAL KIT MICROSEMI, LX1701SPK EVAL KIT Datasheet - Page 6

• Manufacturer Part Number: LX1701SPK EVAL KIT
• Manufacturer: MICROSEMI

Specifications of LX1701SPK EVAL KIT

• Lead Free Status / RoHS Status: Supplier Unconfirmed

A
Copyright © 2004
Rev. 1.1, 2003-05-28
UDIO
MAX LX1701SPK EVAL
THD+N vs. Output Power
Tested signal frequency f=1KHz, through On-Board PC LPF to minimize the switching noise,
keep measuring accuracy
THD+N vs. Frequency
Tested signal level Po=100mW, sweep input signal frequency from 20Hz to 20KHz, through On-
Board PC LPF to minimize the switching noise, keep measuring accuracy
Frequency response
Tested signal level Po=100mW, sweep input signal frequency from 20Hz to 20KHz, not through
On-Board PC LPF, directly test it from OUT+ and OUT-
Change JP3, the BandWidth selection jumper to change the HPF cutoff frequency, then measure
it
Signal-to-Noise Ratio (SNR)
Input short, output through TP1 and TP2 into AP input, AP is set up with FFT digital analyzer
function, A-weighted filter, 0dB as maximum output power with 1%THD+N
Efficiency
Output power vs. power supply power, since resistor is acting as a load even at high switching
frequency, the On-Board load resistor is removed and the output through OUT+/OUT- into a
speaker load because the speaker can act as an inductor to cut off the higher switching frequency
to keep measuring accuracy. Tested signal is f=1KHz sine wave.
GAIN
Same procedure with frequency response, set 0dB as input signal level
Change JP1, the gain selection jumper to change its gain, and measure it
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