AD5253EVAL Analog Devices Inc, AD5253EVAL Datasheet - Page 8

• Manufacturer Part Number: AD5253EVAL
• Manufacturer: Analog Devices Inc

Specifications of AD5253EVAL

• Lead Free Status / RoHS Status: Not Compliant

AD5253/AD5254
ABSOLUTE MAXIMUM RATINGS
TA = 25°C, unless otherwise noted
Table 4.
Parameter
V
V
V
V
Maximum Current
Digital Inputs and Output Voltage to GND
Operating Temperature Range
Maximum Junction Temperature (T
Storage Temperature Range
Lead Temperature (Soldering, 10 sec)
Vapor Phase (60 sec)
Infrared (15 sec)
TSSOP-20 Thermal Resistance
1
2
ESD CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily accumulate on
the human body and test equipment and can discharge without detection. Although this product features
proprietary ESD protection circuitry, permanent damage may occur on devices subjected to high energy
electrostatic discharges. Therefore, proper ESD precautions are recommended to avoid performance
degradation or loss of functionality.
Maximum terminal current is bound by the maximum applied voltage across
any two of the A, B, and W terminals at a given resistance, the maximum
current handling of the switches, and the maximum power dissipation of the
package. V
Package power dissipation = (T
DD
SS
DD
A
, V
I
I
I
I
WB
WB
WA
AB
to GND
to GND
to V
B
(R
, I
, V
Continuous
Continuous (R
Continuous (R
WA
AB
W
SS
to GND
Pulsed
= 1 kΩ/10 kΩ/50 kΩ/100 kΩ)
DD
= 5 V.
WB
WA
≤ 1 kΩ, A Open)
≤ 1 kΩ, B Open)
JMAX
2
− T
θ
JA
A
)/θ
JMAX
JA
.
1
1
1
)
Rating
−0.3 V, +7 V
+0.3 V, −7 V
7 V
V
±20 mA
±5 mA
±5 mA
±5 mA/±500 μA/
±100 μA/±50 μA
0 V, 7 V
−40°C to +85°C
150°C
−65°C to +150°C
300°C
215°C
220°C
143°C/W
SS
, V
DD
Rev. A | Page 8 of 32
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.