2N5551RL1 ON Semiconductor, 2N5551RL1 Datasheet
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2N5551RL1
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2N5551RL1 Summary of contents
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... Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect device reliability. *For additional information on our Pb−Free strategy and soldering details, please download the ON Semiconductor Soldering and Mounting Techniques Reference Manual, SOLDERRM/D. © Semiconductor Components Industries, LLC, 2006 March, 2006 − ...
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ELECTRICAL CHARACTERISTICS Characteristic OFF CHARACTERISTICS Collector−Emitter Breakdown Voltage (Note 1.0 mAdc Collector−Base Breakdown Voltage = 100 mAdc Emitter−Base Breakdown Voltage = 10 mAdc ...
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T = 125°C J 200 25°C 100 −55 ° 7.0 5.0 0.1 0.2 0.3 0.5 0.7 1.0 0.9 0 0.6 0.5 0.4 0.3 0.2 0.1 0 0.005 0.01 ...
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V 10 −8 100 0. INPUT PULSE 5.1 k ≤ ...
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... Device 2N5550 2N5550G 2N5550RLRA 2N5550RLRAG 2N5550RLRP 2N5550RLRPG 2N5551 2N5551G 2N5551RL1 2N5551RL1G 2N5551RLRA 2N5551RLRAG 2N5551RLRM 2N5551RLRMG 2N5551RLRP 2N5551RLRPG 2N55551ZL1 2N55551ZL1G †For information on tape and reel specifications, including part orientation and tape sizes, please refer to our Tape and Reel Packaging Specifications Brochure, BRD8011/D. ...
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... LEAD DIMENSION IS UNCONTROLLED IN P AND D J SECTION X−X N. American Technical Support: 800−282−9855 Toll Free USA/Canada Japan: ON Semiconductor, Japan Customer Focus Center 2−9−1 Kamimeguro, Meguro−ku, Tokyo, Japan 153−0051 Phone: 81−3−5773−3850 http://onsemi.com 6 Y14.5M, 1982. IS UNCONTROLLED. ...