82V2042EPF8 IDT, Integrated Device Technology Inc, 82V2042EPF8 Datasheet - Page 64
82V2042EPF8
Manufacturer Part Number
82V2042EPF8
Description
Manufacturer
IDT, Integrated Device Technology Inc
Datasheet
1.82V2042EPF8.pdf
(83 pages)
Specifications of 82V2042EPF8
Screening Level
Industrial
Mounting
Surface Mount
Package Type
TQFP
Operating Temperature (min)
-40C
Operating Temperature (max)
85C
Lead Free Status / RoHS Status
Not Compliant
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Table-54 TAP Controller State Description (Continued)
IEEE STD 1149.1 JTAG TEST ACCESS PORT
IDT82V2042E
Update-IR
Exit2-IR
STATE
This is a temporary state. While in this state, if TMS is held high, a rising edge applied to TCK causes the controller to enter the Update-IR
state, which terminates the scanning process. If TMS is held low and a rising edge is applied to TCK, the controller enters the Shift-IR state.
The test data register selected by the current instruction retains its previous value and the instruction does not change during this state.
The instruction shifted into the instruction register is latched into the parallel output from the shift-register path on the falling edge of TCK.
When the new instruction has been latched, it becomes the current instruction. The test data registers selected by the current instruction retain
their previous value.
1
0
Test-logic Reset
Run Test/Idle
0
Figure-22 JTAG State Diagram
1
1
0
Capture-DR
Update-DR
Select-DR
Pause-DR
Exit1-DR
Exit2-DR
Shift-DR
1
DUAL CHANNEL T1/E1/J1 SHORT HAUL LINE INTERFACE UNIT
64
0
0
1
0
1
1
0
DESCRIPTION
1
1
0
0
0
1
Capture-IR
Update-IR
Select-IR
Pause-IR
Exit1-IR
Exit2-IR
Shift-IR
1
1
0
1
1
0
0
0
1
0
1
0
December 12, 2005
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