M38510/20702BEA QP SEMICONDUCTOR, M38510/20702BEA Datasheet - Page 19

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M38510/20702BEA

Manufacturer Part Number
M38510/20702BEA
Description
Manufacturer
QP SEMICONDUCTOR
Datasheet

Specifications of M38510/20702BEA

Lead Free Status / RoHS Status
Supplier Unconfirmed
See footnotes at end of table.
Subgroup Symbol
T
25 ° C
T
25 ° C
10
11
C
C
7
8
9
=
=
Same tests, terminal conditions, and limits as for subgroup 7, except T
Same tests, terminal conditions, and limits as for subgroup 9, except T
Same tests, terminal conditions, and limits as for subgroup 9, except T
Func-
t
t
t
t
tional
PHL1
PLH1
PHL2
PLH2
test
GALPAT
GALPAT
Sequen-
Sequen-
method
Fig. 4
Fig. 4
Fig. 4
Fig. 4
STD-
MIL-
883
tial
tial
6/
Cases
Test
E,F
no.
36
37
38
39
40
O
6/
7/
1
1
O
6/
7/
2
2
Terminal conditions (outputs not designated are open or resistive coupled to GND or voltage;
O
6/
7/
3
3
TABLE III. Group A inspection for device types 01 and 03 – Continued.
O
6/
7/
4
4
inputs not designated are ≥ 2.0 V, low ≤ 0.8 V, or open).
O
6/
7/
5
5
C
C
C
= 125 ° C and -55 ° C.
O
6/
7/
= 125 ° C.
= -55 ° C.
6
6
O
6/
7/
7
7
GND
GND
GND
8
O
6/
7/
9
8
10/
10/
10
A
6/
8/
8/
0
10/
10/
A
11
6/
8/
8/
1
10/
10/
12
A
6/
8/
8/
2
10/
10/
13
A
6/
8/
8/
3
10/
10/
14
A
6/
8/
8/
4
GND
GND
CE
10/
10/
15
6/
V
10/
10/
16
6/
8/
8/
CC
Measured
terminal
Outputs
O
O
O
O
O
O
O
O
1
2
3
4
5
6
7
8
Min
Test limits
Max
6/
9/
9/
9/
9/
Unit
ns

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