M38510/20704BEA QP SEMICONDUCTOR, M38510/20704BEA Datasheet - Page 22

• Manufacturer Part Number: M38510/20704BEA
• Manufacturer: QP SEMICONDUCTOR

Specifications of M38510/20704BEA

• Lead Free Status / RoHS Status: Not Compliant

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For programmed devices, select an appropriate address to acquire the desired output state, V
V
For unprogrammed devices, apply 11.0 V on pins 10 ( A
For unprogrammed 02 devices ( V
For unprogrammed devices, apply 12.0 V on pin 14 ( A
This test may, at the manufacturer’s option, be performed with V
50 μA maximum.
The functional tests shall verify that no fuses are blown for unprogrammed devices or that the truth table
specified in the altered item drawing exists for programmed devices (see table II and 3.3.2.2).
All bits shall be tested. Terminal conditions shall be as follows:
a.
b.
c.
The outputs are loaded per figure 4.
GALPAT (PROGRAMMED PROM).
This program will test all bits in the array, the addressing and interaction between bits for ac performance
t
Description:
Step 1. Word 0 is read.
Step 2. Word 1 is read.
Step 3. Word 0 is read
Step 4. Word 2 is read.
Step 5. Word 0 is read.
Step 6. The reading procedure continues back and forth between word 0 and the next higher numbered word
Step 7. Pass execution time = ( n
Step 8. The GALPAT tests shall be performed with V
PHL1
IH
= 2.0 V.
Inputs: H = 3.0 V, L = 0.0 V.
Outputs: Output voltage shall be: H ≥ 1.0 V and L < 1.0 V.
The functional tests shall be performed with V
and t
until word 255 is reached, then increments to the next word and reads back and forth as in step 1
through step 6 and shall include all words.
PLH1
. Each bit in the pattern is fixed by being programmed with a “H” and “L”.
Device
01, 02
03, 04
TABLE III. Group A inspection – Continued.
OL
2
t
80 ns
35 ns
PHL1
+ n ) x cycle time. N = 256.
test ), apply 0 V on pins 10 ( A
MIL-M-38510/207E
CC
t
80 ns
35 ns
PLH1
22
= 4.5 V and V
CC
4
0
) for circuit B devices.
= 4.5 V and 5.5 V.
) and 14 ( A
IH
= 5.5 V (pin 15) and test limit of
CC
t
50 ns
25 ns
0
PHL2
4
) through 14 ( A
= 5.5 V.
) for circuit A devices.
t
50 ns
25 ns
PLH2
4
) for circuit G.
IL
= 0.8 V,