M38510/20302BEA QP SEMICONDUCTOR, M38510/20302BEA Datasheet - Page 7

• Manufacturer Part Number: M38510/20302BEA
• Manufacturer: QP SEMICONDUCTOR

Specifications of M38510/20302BEA

• Lead Free Status / RoHS Status: Not Compliant

electrical parameters shall be as specified in table II herein.
conventional and positive when flowing into the referenced terminal.
4.4.1 Group A inspection. Group A inspection shall be in accordance with table III of MIL-PRF-38535 and as follows:
4.4.2 Group B inspection. Group B inspection shall be in accordance with table II MIL-PRF-38535.
4.4.3 Group C inspection. Group C inspection shall be in accordance with table IV of MIL-PRF-38535 and as follows:
4.4.4 Group D inspection. Group D inspection shall be in accordance with table V of MIL-PRF-38535. End-point
4.5 Methods of inspection. Methods of inspection shall be as specified and as follows:
4.5.1 Voltage and current. All voltages given are referenced to the microcircuit ground terminal. Currents given are
a. Electrical test requirements shall be as specified in table II herein.
b. Subgroups 4, 5, and 6 shall be omitted.
c. For unprogrammed devices, a sample shall be selected to satisfy programmability requirements prior to
d. For unprogrammed devices, 10 devices from the programmability sample shall be submitted to the
a. End-point electrical parameters shall be as specified in table II herein.
b. The steady-state life test duration, test condition, and test temperature, or approved alternatives shall be as
c. For qualification, at least 50 percent of the sample selected for life testing shall be programmed (see 3.3.2).
performing subgroups 9. 10, and 11. Twelve devices shall be submitted to programming (see 3.3.2.1). If
more than 2 devices fail to program, the lot shall be rejected, At the manufacturer’s option, the sample may
be increased to 24 total devices with no more than 4 total device failures allowable.
requirements of group A, subgroups 9, 10, and 11. If more than two total devices fail in all three subgroups,
the lot shall be rejected. At the manufacturer’s option, the sample may be increased to 20 total devices with
no more than 4 total device failures allowable.
specified in the device manufacturer's QM plan in accordance with MIL-PRF-38535. The burn-in test circuit
shall be maintained under document control by the device manufacturer's Technology Review Board (TRB) in
accordance with MIL-PRF-38535 and shall be made available to the acquiring or preparing activity upon
request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in
accordance with the intent specified in test method 1005 of MIL-STD-883.
For quality conformance inspection, the programmability sample (see 4.4.1c) shall be included in the life test.
MIL-M-38510/203E
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