MD2533-D8G-X-P-T SanDisk, MD2533-D8G-X-P-T Datasheet - Page 35
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MD2533-D8G-X-P-T
Manufacturer Part Number
MD2533-D8G-X-P-T
Description
Manufacturer
SanDisk
Type
Flash Disk Moduler
Datasheet
1.MD2533-D8G-X-P-T.pdf
(87 pages)
Specifications of MD2533-D8G-X-P-T
Density
1GByte
Operating Supply Voltage (typ)
1.8/3.3V
Operating Temperature (min)
-40C
Operating Temperature (max)
85C
Package Type
FBGA
Mounting
Surface Mount
Pin Count
115
Operating Temperature Classification
Industrial
Operating Supply Voltage (min)
1.65/2.7V
Operating Supply Voltage (max)
1.95/3.6V
Programmable
Yes
Lead Free Status / RoHS Status
Supplier Unconfirmed
Rev. 1.2
6.3
DOC Driver Software Development Kit (SDK) provides the source code for the DOC Driver. It
can be used in an OS-less environment or when special customization of the driver is required
for proprietary OSs. The DOC Driver SDK is used also for utilizing mDOC H3 as the boot
device. TrueFFS 7.1 Software Development Kit (TrueFFS 7.1 SDK) provides the DOC Driver
code, bundled with the TrueFFS code needed to support earlier mDOC technologies (such as G3,
G4 and H1) as well.
6.3.1
DOC Driver accesses the flash memory within mDOC H3 through either 8KB or 128KB window
in the CPU memory space, depending on the mDOC H3 configuration. DOC Driver provides
block device API by using standard file system calls, identical to those used for a hard disk, to
enable reading from and writing to mDOC H3. This makes mDOC H3 compatible with any file
system and file system utilities, such as diagnostic tools and applications.
Note: mDOC H3 is shipped unformatted and contains virgin media.
6.3.2
Since NAND flash is an imperfect storage media, it can contain bad blocks that cannot be used
for storage because of their high error rates. Embedded TrueFFS automatically detects and maps
out bad blocks upon system initialization, ensuring that they are not used for storage. During run-
time, if additional bad blocks are detected they are automatically retired and replaced by blocks
that are located in a pool of spares. This management process is completely transparent to the
user, who is unaware of the existence and location of bad blocks, while remaining confident of
the integrity of data stored.
6.3.3
Flash memory can be erased a limited number of times. This number is called the erase cycle
limit, or write endurance limit, and is defined by the flash device vendor. The erase cycle limit
applies to each individual erase block in the flash device.
In a typical application, and especially if a file system is used, specific pages are constantly
updated (e.g., the pages that contain the FAT, registry, etc.). Without any special handling, these
pages would wear out more rapidly than other pages, reducing the lifetime of the entire flash.
To overcome this inherent deficiency, Embedded TrueFFS uses SanDisk’s patented wear-
leveling algorithm. This wear-leveling algorithm ensures that consecutive writes of a specific
sector are not written physically to the same page in the flash. This spreads flash media usage
evenly across all pages, thereby maximizing flash lifetime.
Dynamic Wear-Leveling
Embedded TrueFFS uses statistical allocation to perform dynamic wear-leveling on newly
written data. This means that new data will be written to flash units which are less worn out.
35
DOC Driver Software Development Kit (SDK)
File Management
Bad-Block Management
Wear-Leveling
mDOC H3 EFD Featuring Embedded TrueFFS Data Sheet
Embedded TrueFFS Technology
92-DS-1205-10