5962-9080304MLA QP SEMICONDUCTOR, 5962-9080304MLA Datasheet - Page 12

• Manufacturer Part Number: 5962-9080304MLA
• Manufacturer: QP SEMICONDUCTOR

Specifications of 5962-9080304MLA

• Lead Free Status / RoHS Status: Supplier Unconfirmed

DSCC FORM 2234
APR 97
or approved alternatives shall be as specified in the device manufacturer's QM plan in accordance with MIL-PRF-38535. The
test circuit shall be maintained under document revision level control by the device manufacturer's TRB in accordance with
MIL-PRF-38535 and shall be made available to the acquiring or preparing activity upon request. The test circuit shall specify the
inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1005 of MIL-STD-
883.
4.4.2 Group C inspection. The group C inspection end-point electrical parameters shall be as specified in table IIA herein.
4.4.2.1 Additional criteria for device class M. Steady-state life test conditions, method 1005 of MIL-STD-883:
4.4.2.2 Additional criteria for device classes Q and V. The steady-state life test duration, test condition and test temperature,
4.4.3 Group D inspection. The group D inspection end-point electrical parameters shall be as specified in table IIA herein.
4.4.1 Group A inspection.
f.
a.
b.
c.
a.
b. Subgroups 5 and 6 in table I, method 5005 of MIL-STD-883 shall be omitted.
c.
e. Unprogrammed devices shall be tested for programmability and ac performance compliance to the requirements of
d.
DEFENSE SUPPLY CENTER COLUMBUS
O/V (latch-up) tests shall be measured only for initial qualification and after any design or process changes which may
affect the performance of the device. For device class M, procedures and circuits shall be maintained under document
revision level control by the manufacturer and shall be made available to the preparing activity or acquiring activity upon
request. For device classes Q and V, the procedures and circuits shall be under the control of the device
manufacturer's TRB in accordance with MIL-PRF-38535 and shall be made available to the preparing activity or
acquiring activity upon request. Testing shall be on all pins, on five devices with zero failures. Latch-up test shall be
considered destructive. Information contained in JEDEC Standard EIA/JESD 78 may be used for reference.
Test condition D. The test circuit shall be maintained by the manufacturer under document revision level control and
shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify the inputs,
outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1005 of MIL-
STD-883.
T
Test duration: 1,000 hours, except as permitted by method 1005 of MIL-STD-883.
changes which may affect input or output capacitance. Capacitance shall be measured between the designated
terminal and GND at a frequency of 1 MHz. Sample size is 15 devices with no failures, and all input and output
terminals tested.
group A, subgroups 9, 10, and 11. Either of two techniques is acceptable:
Tests shall be as specified in table IIA herein.
For device class M, subgroups 7 and 8 tests shall be sufficient to verify the truth table. For device classes Q and V,
subgroups 7 and 8 shall include verifying the functionality of the device.
Subgroup 4 (C
A
(1) Testing the entire lot using additional built-in test circuitry which allows the manufacturer to verify
(2) If such compliance cannot be tested on an unprogrammed device, a sample shall be selected to satisfy
= +125°C, minimum.
MICROCIRCUIT DRAWING
COLUMBUS, OHIO 43218-3990
programmability and ac performance without programming the user array. If this is done, the resulting test
patterns shall be verified on all devices during subgroups 9, 10, and 11, group A testing in accordance with the
sampling plan specified in MIL-STD-883, method 5005.
programmability requirements prior to performing subgroups 9, 10, and 11. Twelve devices shall be submitted to
programming (see 4.4). If more than two devices fail to program, the lot shall be rejected. At the manufacturer's
option, the sample may be increased to 24 total devices with no more than four total device failures allowable.
Ten devices from the programmability sample shall be submitted to the requirements of group A, subgroups 9,
10, and 11. If more than two devices fail, the lot shall be rejected. At the manufacturer's option, the sample may
be increased to 20 total devices with no more than four total device failures allowable.
STANDARD
IN
and C
OUT
measurements) shall be measured only for the initial test and after process or design
SIZE
A
REVISION LEVEL
C
SHEET
5962-90803
12