5962-9055503LA QP SEMICONDUCTOR, 5962-9055503LA Datasheet - Page 12

• Manufacturer Part Number: 5962-9055503LA
• Manufacturer: QP SEMICONDUCTOR

Specifications of 5962-9055503LA

• Lead Free Status / RoHS Status: Supplier Unconfirmed

DSCC FORM 2234
APR 97
STD-883 including groups A, B, C, and D inspections. The following additional criteria shall apply.
MIL-STD-883, method 3015. ESDS testing shall be measured only for initial qualification and after process or design
changes which may affect ESDS classification.
be made available upon request.
4.3 Quality conformance inspection. Quality conformance inspection shall be in accordance with method 5005 of MIL-
4.3.1 Group A inspection.
4.3.2 Groups C and D inspections.
4.4 Programming procedures. The programming procedures shall be as specified by the device manufacturer and shall
4.5 Electrostatic discharge sensitivity (ESDS) inspection. ESDS testing shall be performed in accordance with
a.
b.
c.
d.
e.
a.
b.
(1)
performing subgroups 9, 10, and 11. Twelve devices shall be submitted to programming (see 3.2.3.1). If more than
two devices fail to program, the lot shall be rejected. At the manufacturer's option, the sample may be increased to
24 total devices with no more than 4 total device failures allowable.
(1)
(2)
(3)
DEFENSE SUPPLY CENTER COLUMBUS
Tests shall be as specified in table II herein.
Subgroups 5 and 6 in table I, method 5005 of MIL-STD-883 shall be omitted.
Subgroup 4 (C
changes which may affect input capacitance. Sample size is 15 devices with no failures, and all input and output
terminals tested.
Subgroups 7 and 8 shall include verification of the truth table.
Unprogrammed devices shall be tested for programmability and ac performance compliance to the requirements
of group A, subgroups 9, 10, and 11.
(2)
End-point electrical parameters shall be as specified in table II herein.
Steady-state life test conditions, method 1005 of MIL-STD-883.
MICROCIRCUIT DRAWING
Test condition C or D. The test circuit shall be maintained by the manufacturer under document revision level
control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall
specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent
specified in method 1005 of MIL-STD-883.
T
Test duration: 1,000 hours, except as permitted by method 1005 of MIL-STD-883.
COLUMBUS, OHIO 43218-3990
Ten devices from the programmability sample shall be submitted to the requirements of group A, subgroups
9, 10, and 11. If more than two devices fail, the lot shall be rejected. At the manufacturer's option, the
sample may be increased to 20 total devices with no more than 4 total device failures allowable.
A
= +125°C, minimum.
STANDARD
IN
and C
OUT
measurement) shall be measured only for the initial test and after process or design
A sample shall be selected to satisfy programmability requirements prior to
SIZE
A
REVISION LEVEL
B
SHEET
5962-90555
12