IDT74SSTV16859PA IDT, Integrated Device Technology Inc, IDT74SSTV16859PA Datasheet - Page 5

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IDT74SSTV16859PA

Manufacturer Part Number
IDT74SSTV16859PA
Description
Manufacturer
IDT, Integrated Device Technology Inc
Datasheet

Specifications of IDT74SSTV16859PA

Logic Family
SSTV
Logical Function
Registered Buffer
Number Of Elements
1
Number Of Bits
13
Number Of Inputs
13
Number Of Outputs
26
High Level Output Current
-20mA
Low Level Output Current
20mA
Package Type
TSSOP
Propagation Delay Time
2.8ns
Operating Supply Voltage (typ)
2.5V
Operating Supply Voltage (max)
2.7V
Operating Supply Voltage (min)
2.3V
Clock-edge Trigger Type
Posit/Negat-Edge
Polarity
Non-Inverting
Technology
CMOS
Frequency (max)
200(Min)MHz
Mounting
Surface Mount
Pin Count
64
Operating Temp Range
-40C to 85C
Operating Temperature Classification
Industrial
Lead Free Status / RoHS Status
Not Compliant
NOTES:
1. C
2. I
3. All input pulses are supplied by generators having the following characteristics: PRR ≤10MHz, Z
4. The outputs are measured one at a time with one transition per measurement.
5. V
6. V
7. V
8. t
TEST CIRCUITS AND WAVEFORMS (V
IDT74SSTV16859
13-BIT TO 26-BIT REGISTERED BUFFER WITH SSTL I/O
LVCMOS
Input
Timing
RESET
(see note 2)
I
DD
PLH
DD
Input
Input
TT
IH
IL
Input
L
includes probe and jig capacitance.
= V
= V
tested with clock and data inputs held at V
= V
and t
REF
REF
REF
PHL
t
INACT
Voltage Waveforms - Setup and Hold Times
+ 310mV (AC voltage levels) for differential inputs. V
- 310mV (AC voltage levels) for differential inputs. V
= V
are the same as t
DDQ
Voltage Waveforms - Pulse Duration
Inputs Active and Inactive Times
Voltage and Current Waveforms
/2
V
DD
V
/2
REF
V
10%
REF
t
SU
PD
.
t
W
V
ICR
DD
t
N
or GND, and I
From Output
Under Test
V
REF
V
V
DD
REF
/2
O
90%
t
IL
IH
ACT
= 0mA.
= GND for LVCMOS input.
= V
DD
V
V
V
IH
IL
V
V
V
0V
for LVCMOS input.
DD
I(PP)
IH
IL
Load Circuit
DD
5
= 2.5V ± 0.2V)
LVCMOS
Timing
Output
RESET
Output
Input
V
O
Input
TT
Voltage Waveforms - Propagation Delay Times
Voltage Waveforms - Propagation Delay Times
= 50Ω, input slew rate = 1 V/ns ±20% (unless otherwise specified).
R
Test Point
C
(see note 1)
L
L
= 50Ω
= 30 pF
t
PLH
V
ICR
V
TT
INDUSTRIAL TEMPERATURE RANGE
V
DD
/2
t
V
PHL
V
ICR
TT
V
t
PHL
TT
V
V
V
V
V
I(PP)
V
V
OH
OL
OH
OL
IH
IL

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