GNM314R72A331KD01D Murata, GNM314R72A331KD01D Datasheet - Page 118
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GNM314R72A331KD01D
Manufacturer Part Number
GNM314R72A331KD01D
Description
Manufacturer
Murata
Type
Ceramicr
Datasheet
1.GNM314R72A331KD01D.pdf
(220 pages)
Specifications of GNM314R72A331KD01D
Capacitance
330pF
No. Of Capacitors
4
Tolerance (+ Or -)
10%
Voltage
100VDC
Number Of Terminals
8Terminal
Temp Coeff (dielectric)
X7R
Operating Temp Range
-55C to 125C
Mounting Style
Surface Mount
Package / Case
1206
Construction
SMT Chip
Failure Rate
Not Required
Product Height (mm)
0.8mm
Product Depth (mm)
1.6mm
Product Length (mm)
3.2mm
Lead Diameter (nom)
Not Requiredmm
Terminal Pitch
0.8mm
Lead Free Status / RoHS Status
Compliant
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!Note
• This PDF catalog is downloaded from the website of Murata Manufacturing co., ltd. Therefore, it’s specifications are subject to change or our products in it may be discontinued without advance notice. Please check with our
• This PDF catalog has only typical specifications because there is no space for detailed specifications. Therefore, please approve our product specifications or transact the approval sheet for product specifications before ordering.
sales representatives or product engineers before ordering.
!Note
116
No.
10
ERB Series Specifications and Test Method (1)
ERB Series Specifications and Test Methods
1
2
3
4
5
6
7
8
9
Capacitance
Temperature
Characteristics
Operating
Temperature Range
Rated Voltage
Appearance
Dimensions
Dielectric Strength
Insulation Resistance
(I.R.)
Capacitance
Q
Adhesive Strength
of Termination
• Please read rating and !CAUTION (for storage, operating, rating, soldering, mounting and handling) in this catalog to prevent smoking and/or burning, etc.
• This catalog has only typical specifications because there is no space for detailed specifications. Therefore, please approve our product specifications or transact the approval sheet for product specifications before ordering.
Item
Capacitance
Change
Temperature
Coefficient
Capacitance
Drift
Y55 to W125D
See the previous pages.
No defects or abnormalities
Within the specified dimension
No defects or abnormalities
1,000,000MΩ min. (CV470pF)
0,100,000MΩ min. (CG470pF)
Within the specified tolerance
220pF<CV1,220pF : QU10,000
220pF<CV1,470pF : QU15,000
470pF<CV1,000pF : QU13,000
C: Nominal Capacitance (pF)
Within the specified tolerance (Table A-6)
Within the specified tolerance (Table A-6)
Within T0.2% or T0.05pF
(Whichever is larger)
No removal of the terminations or other defects should occur.
Specifications
Fig.1
c
Solder Resist
Baked Electrode or
Copper Foil
Reference Temperature: 25°C
The rated voltage is defined as the maximum voltage which
may be applied continuously to the capacitor.
When AC voltage is superimposed on DC voltage, V
whichever is larger, should be maintained within the rated
voltage range.
Visual inspection
Using calipers
No failure should be observed when 300%(*) of the rated volt-
age is applied between the terminations for 1 to 5 seconds,
provided the charge/discharge current is less than 50mA.
(*) 300V: 250%, 500V: 200%
The insulation resistance should be measured with a DC
voltage not exceeding the rated voltage at 25D and standard
humidity and within 2 minutes of charging.
The capacitance/Q should be measured at 25D at the
frequency and voltage shown in the table.
The temperature coefficient is determined using the
capacitance measured in step 3 as a reference. When cycling
the temperature sequentially from step 1 through 5, the
capacitance should be within the specified tolerance for the
temperature coefficient and capacitance change as Table A.
The capacitance drift is calculated by dividing the differences
between the maximum and minimum measured values in steps
1, 3 and 5 by the capacitance value in step 3.
Solder the capacitor on the test jig (glass epoxy board) shown
in Fig. 1 using an eutectic solder.
Then apply 10N* force in parallel with the test jig for 10±1sec.
The soldering should be done either with an iron or using the
reflow method and should be conducted with care so that the
soldering is uniform and free of defects such as heat shock.
Frequency
Voltage
ERB18
ERB21
ERB32
Step
Type
1
2
3
4
5
Test Method
1.0
1.2
2.2
a
Continued on the following page.
Temperature (D)
Y55T3
1T0.2Vrms
125T3
1T0.1MHz
25T2
25T2
25T2
3.0
4.0
5.0
b
*5N (ERB188)
(in mm)
P-P
1.65
1.2
2.9
c
or V
O-P
,
C02E.pdf
09.9.18
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