M38510/21002BJA E2V, M38510/21002BJA Datasheet - Page 45

• Manufacturer Part Number: M38510/21002BJA
• Manufacturer: E2V

Specifications of M38510/21002BJA

• Lead Free Status / RoHS Status: Supplier Unconfirmed

1/ For unprogrammed devices, apply 13.0 V on pin 1(A7) and pin 2 (A6), for device types 01 and 02, and on pin 1
2/ For programmed devices, select an appropriate address to acquire the desired output state. V
3/ I
4/ The functional tests shall verify that no fuses are blown for unprogrammed devices or that the altered item drawing
5/ GALPAT (programmed PROM). This program will test all bits in the array, the addressing and interaction between
6/ The outputs are loaded per figure 4.
7/ t
8/ Sequential test (programmed PROM). This program will test all bits in the array for t
9/ t
10/ For uprogrammed devices, apply 13 V on pin 8 (A0) for circuit I devices.
11/ For unprogrammed devices, 12.0 V on pin 6 (A2) and 0.0 V on pin 5 (A3) for circuit F devices.
12/ For unprogrammed devices, apply 13 V on pin 2 (A6) for circuit I devices.
(A8) for device type 05 for circuit A devices.
V
pattern exists for programmed devices (see table II and 3.3.2.1). All bits shall be tested. Terminal conditions shall
be as follows:
bits for ac performance, t
OL
PHL1
PHL2
IL
a. Inputs: H = 2.4 V, L = 0.4 V
b. Outputs: Output voltage shall be:
= 8 mA for circuits C and G. I
c. The functional tests shall be performed with V
Description:
Description:
= 0.8 V.
, t
, t
PLH1
PLH2
1. Word 0 is read.
2. Word 1 is read.
3. Word 0 is read.
4. Word 2 is read.
5. Word 0 is read.
6. The reading procedure continues back and forth between word 0 and the next higher numbered
7. Pass execution time = (n
8. The GALPAT tests shall be performed with V
1. Each word in the pattern is tested from the enable lines to the output lines for recovery.
2. Word 0 is addressed. Enable line is pulled HI to LO and LO to HI. t
3. Word 1 is addressed. Same enable sequence as above.
4. The reading procedure continues until word 2047 or 4095 is reached.
5. Pass execution time = 2048 x cycle time (or 4096 x cycle time).
6. The sequential tests shall be performed with V
H ≥ 1.5 V and L ≤ 1.5 V.
= 100 ns for device types 01 and 02 and 55 ns for device types 03 and 04.
= 50 ns for device types 01 and 02 and 30 ns for device types 03 and 04.
word until word 2047 or 4095 is reached, then increments to the next word and reads back and
forth as in step 1 through 7 and shall include all words.
PHL1
and t
OL
PLH1
= 16 mA for circuits A, B, D, F, H, I, and J.
2
+ n) x cycle time. n = 2048 or 4096.
. Each bit in the pattern is fixed by being programmed with an “H” or “L”.
MIL-M-38510/210E
CC
45
= 4.5 V and V
CC
CC
= 4.5 V and 5.5 V.
= 4.5 V and 5.5 V.
CC
= 5.5 V.
PHL2
and t
PHL2
PLH2
and t
are read.
PLH2
IH
= 2.0 V,
.