499160-2 TE Connectivity, 499160-2 Datasheet - Page 3

014 UNIV HDR SP 4S 30DP STD L2

499160-2

Manufacturer Part Number
499160-2
Description
014 UNIV HDR SP 4S 30DP STD L2
Manufacturer
TE Connectivity
Datasheets

Specifications of 499160-2

Rohs Compliant
NO
Product Line
AMP-LATCH
Profile
Standard
Pcb Mounting Orientation
Vertical
Pcb Mount Retention
Without
Mating Connector Lock
With
Housing Style
4-Sided
Ejection Latches
With
Post Size (mm [in])
0.64 [.025]
Shrouded
Yes
Latch Type
Short
Mating Connector Lock Type
Latch
Termination Post Length (mm [in])
2.79 [0.110]
Solder Tail Contact Plating
Tin-Lead
Header Type
Universal Ejection Pin Headers
Number Of Positions
14
Centerline, Matrix (mm [in])
2.54 x 2.54 [.100 x .100]
Preloaded
Yes
Contact Plating, Mating Area, Material
Gold (30)
Contact Shape
Square
Connector Style
Header - Pin
Mating Alignment Type
Center, Dual Polarizing Bar, Military
Mating Alignment
With
Housing Material
Thermoplastic - GF
Ul Flammability Rating
UL 94V-0
Housing Color
Black
Rohs/elv Compliance
ELV compliant, 5 of 6 Compliant
Lead Free Solder Processes
Wave solder capable to 240°C, Wave solder capable to 260°C, Wave solder capable to 265°C
Temperature Rating
Standard
Pcb Thickness, Recommended (mm [in])
1.57 [0.062]
3.6.
Therm al shock.
Hum idity/tem perature cycling.
Rev F
NOTE
Product Qualification and Requalification Test Sequence
NOTE
Test Description
Shall meet visual requirements, show no physical damage and shall meet requirements of
additional tests as specified in Test Sequence in Figure 2.
(a)
(b)
See paragraph 4.1.A.
Numbers indicate sequence in which tests are performed.
Exam ination of product
Insulation resistance
W ithstanding voltage
Solderability
Com ponent resistance to wave soldering
Contact retention
Therm al shock
Hum idity/tem perature cycling
Test or Exam ination
See Note.
See Note.
ENVIRONMENTAL
Figure 1 (end)
Requirem ent
Figure 2
1,3,5
Test Sequence (b)
2
1
4
Test Group (a)
EIA-364-32, Test Condition II.
Subject unm ated specim ens to 5
cycles between -65 and 105°C with
30 m inute dwells at tem perature
extrem es.
EIA-364-31, Method III.
Subject unm ated specim ens to 10
cycles (10 days) between 25 and
65°C at 80 to 100% RH with cold
shock.
1,3
2
2
1,8
2,6
3,7
3
4
5
Procedure
108-40018
3 of 5

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