LTC2208CUP#TRPBF Linear Technology, LTC2208CUP#TRPBF Datasheet - Page 18

IC ADC 16BIT 130MSPS 64-QFN

LTC2208CUP#TRPBF

Manufacturer Part Number
LTC2208CUP#TRPBF
Description
IC ADC 16BIT 130MSPS 64-QFN
Manufacturer
Linear Technology
Datasheet

Specifications of LTC2208CUP#TRPBF

Number Of Bits
16
Sampling Rate (per Second)
130M
Data Interface
Parallel
Number Of Converters
1
Power Dissipation (max)
1.78W
Voltage Supply Source
Single Supply
Operating Temperature
0°C ~ 70°C
Mounting Type
Surface Mount
Package / Case
64-WFQFN, Exposed Pad
Lead Free Status / RoHS Status
Lead free / RoHS Compliant

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LTC2208
APPLICATIONS INFORMATION
CONVERTER OPERATION
The LTC2208 is a CMOS pipelined multistep converter
with a front-end PGA. As shown in Figure 1, the converter
has fi ve pipelined ADC stages; a sampled analog input
will result in a digitized value seven cycles later (see the
Timing Diagrams section). The analog input is differen-
tial for improved common mode noise immunity and to
maximize the input range. Additionally, the differential
input drive will reduce even order harmonics of the sample
and hold circuit. The encode input is also differential for
improved common mode noise immunity.
The LTC2208 has two phases of operation, determined
by the state of the differential ENC
brevity, the text will refer to ENC
ENC high and ENC
Each pipelined stage shown in Figure 1 contains an ADC,
a reconstruction DAC and an interstage amplifi er. In op-
eration, the ADC quantizes the input to the stage and the
quantized value is subtracted from the input by the DAC
to produce a residue. The residue is amplifi ed and output
by the residue amplifi er. Successive stages operate out
of phase so that when odd stages are outputting their
residue, the even stages are acquiring that residue and
vice versa.
When ENC is low, the analog input is sampled differen-
tially directly onto the input sample-and-hold capacitors,
inside the “input S/H” shown in the block diagram. At the
instant that ENC transitions from low to high, the voltage
on the sample capacitors is held. While ENC is high, the
held input voltage is buffered by the S/H amplifi er which
drives the fi rst pipelined ADC stage. The fi rst stage acquires
the output of the S/H amplifi er during the high phase of
ENC. When ENC goes back low, the fi rst stage produces
its residue which is acquired by the second stage. At the
same time, the input S/H goes back to acquiring the analog
input. When ENC goes high, the second stage produces
its residue which is acquired by the third stage. An iden-
tical process is repeated for the third and fourth stages,
resulting in a fourth stage residue that is sent to the fi fth
stage for fi nal evaluation.
Each ADC stage following the fi rst has additional range to
accommodate fl ash and amplifi er offset errors. Results
from all of the ADC stages are digitally delayed such that
the results can be properly combined in the correction
logic before being sent to the output buffer.
18
+
less than ENC
+
+
greater than ENC
/ENC
as ENC low.
input pins. For
as
SAMPLE/HOLD OPERATION AND INPUT DRIVE
Sample/Hold Operation
Figure 2 shows an equivalent circuit for the LTC2208 CMOS
differential sample and hold. The differential analog inputs
are sampled directly onto sampling capacitors (C
through NMOS transitors. The capacitors shown attached
to each input (C
capacitance associated with each input.
During the sample phase when ENC is low, the NMOS
transistors connect the analog inputs to the sampling
capacitors and they charge to, and track the differential
input voltage. When ENC transitions from low to high, the
sampled input voltage is held on the sampling capacitors.
During the hold phase when ENC is high, the sampling
capacitors are disconnected from the input and the held
voltage is passed to the ADC core for processing. As ENC
transitions for high to low, the inputs are reconnected to
the sampling capacitors to acquire a new sample. Since
the sampling capacitors still hold the previous sample,
a charging glitch proportional to the change in voltage
between samples will be seen at this time. If the change
between the last sample and the new sample is small,
the charging glitch seen at the input will be small. If the
ENC
ENC
A
A
IN
IN
+
+
LTC2208
V
DD
1.6V
1.6V
6k
V
6k
Figure 2. Equivalent Input Circuit
DD
PARASITIC
V
DD
) are the summation of all other
C
1.8pF
C
1.8pF
PARASITIC
PARASITIC
C
C
SAMPLE
SAMPLE
4.9pF
4.9pF
SAMPLE
2208 F02
2208fc
)

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