583649-3 TE Connectivity, 583649-3 Datasheet - Page 2

CONT.CRP.SNAP TW.LF.STRIP

583649-3

Manufacturer Part Number
583649-3
Description
CONT.CRP.SNAP TW.LF.STRIP
Manufacturer
TE Connectivity
Datasheets

Specifications of 583649-3

Rohs Compliant
NO
Product Type
Contact
Termination Method To Wire/cable
Crimp
Wire Insulation Diameter (mm [in])
1.14 – 2.41 [0.045 – 0.095]
Color Code
Violet
Contact Retention In Housing
Crimp Snap-In
Solder Tail Contact Plating
Nickel (30)
Centerline (mm [in])
3.18 [0.125], 3.96 [0.156]
Wire Range (mm [awg])
0.30-0.90² [22-18]
Contact Configuration
Bifurcated
Contact Plating, Mating Area, Material
Gold (30)
Contact Base Material
Phosphor Bronze
Rohs/elv Compliance
Not ELV/RoHS compliant
Lead Free Solder Processes
Not relevant for lead free process
Contact Packaging Method
Strip Form
3.4.
Examination of Product
Termination Resistance,
Specified Current
Termination Resistance,
Dry Circuit
Dielectric Withstanding
Voltage
Insulation Resistance
Current Cycling
Crimp Resistance
Vibration
Physical Shock
Rev D
Test Requirements and Procedures Summary
Test Description
Test Description
Meets requirements of product
drawing.
10 milliohms maximum initial
10 milliohms maximum initial.
See Figure 3.
5000 megohms minimum initial.
Crimp resistance not to exceed
final value.
No discontinuities greater
than 1 microsecond. No
physical damage.
No discontinuities greater
than 1 microsecond.
No physical damage.
AWG
28
26
24
22
20
18
16
Figure 1 (continued)
Current
MECHANICAL
ELECTRICAL
Test
10.0
12.5
Requirement
Requirement
1.0
1.0
3.0
5.0
7.5
Init
3.0
2.5
2.0
1.2
0.7
0.5
0.4
Milliohms
Final
5.0
4.0
3.3
2.0
1.2
0.8
0.7
Visual, dimensional and functional
per applicable inspection plan.
Measure potential drop of mated
contacts at 1 ampere test current
assembled in housing, see Figure
5; Test Specification 109-25,
calculate resistance.
Subject mated contacts assembled
in housing to 50 mv open circuit at
100 ma maximum, see Figure 5;
Test Specification 109-6-1.
Test between adjacent contacts of
unmated connector assemblies;
and contacts to mounting
hardware;
Test Specification 109-29-1.
Test between adjacent contacts of
unmated connector assembly; Test
Specification 109-28-4, 500 vdc.
Subject mated contacts to 50
cycles at 125% rated current for 30
minutes "ON" - 15 minutes "OFF";
Test Specification 109-51, cond B,
test method 3.
Measure potential drop across
crimped contacts between wire as
it enters the wire barrel and the
end of the wire barrel nearest the
contact transition; see Figure 6;
Test Specification 109-25.
Subject mated connectors to 10-
55-10 Hz traversed in 1 minute at
.06 inches total excursion; 2 hours
in each of 3 mutually perpendicular
planes; Test Specification 109-21-
1.
Subject mated connector to 100
G's sawtooth in 6 milliseconds; 3
shocks in each direction applied
along the 3 mutually perpendicular
planes total 18 shocks; Test
Specification 109-26-9.
Procedure
Procedure
108-9031
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