MAX1186ECM+TD Maxim Integrated Products, MAX1186ECM+TD Datasheet - Page 17

• Manufacturer Part Number: MAX1186ECM+TD
• Description: IC ADC 10BIT 40MSPS DL 48-TQFP
• Manufacturer: Maxim Integrated Products

Specifications of MAX1186ECM+TD

• Number Of Bits: 10
• Sampling Rate (per Second): 40M
• Data Interface: Parallel
• Number Of Converters: 2
• Power Dissipation (max): 150mW
• Voltage Supply Source: Single Supply
• Operating Temperature: -40°C ~ 85°C
• Mounting Type: Surface Mount
• Package / Case: 48-TQFP Exposed Pad, 48-eTQFP, 48-HTQFP, 48-VQFP
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant

Integral nonlinearity is the deviation of the values on an
actual transfer function from a straight line. This straight
line can be either a best straight-line fit or a line drawn
between the endpoints of the transfer function, once
offset and gain errors have been nullified. The static lin-
earity parameters for the MAX1186 are measured using
the best straight-line fit method.
Differential nonlinearity is the difference between an
actual step width and the ideal value of 1 LSB. A DNL
error specification of less than 1 LSB guarantees no
missing codes and a monotonic transfer function.
Figure 6. Transformer-Coupled Input Drive
Internal Reference and Multiplexed Parallel Outputs
Static Parameter Definitions
Dual 10-Bit, 40Msps, 3V, Low-Power ADC with
Differential Nonlinearity (DNL)
______________________________________________________________________________________
Integral Nonlinearity (INL)
V
V
IN
IN
0.1µF
0.1µF
N.C.
N.C.
MINICIRCUITS
MINICIRCUITS
3
3
1
2
1
2
TT1–6
TT1–6
T1
T1
6
5
4
6
5
4
2.2µF
2.2µF
25Ω
25Ω
25Ω
25Ω
0.1µF
0.1µF
22pF
22pF
22pF
22pF
Figure 9 depicts the aperture jitter (t
sample-to-sample variation in the aperture delay.
Aperture delay (t
falling edge of the sampling clock and the instant when
an actual sample is taken (Figure 9).
For a waveform perfectly reconstructed from digital
samples, the theoretical maximum SNR is the ratio of
the full-scale analog input (RMS value) to the RMS
quantization error (residual error). The ideal, theoretical
minimum analog-to-digital noise is caused by quantiza-
Dynamic Parameter Definitions
INA+
COM
INA-
INB+
INB-
MAX1186
AD
Signal-to-Noise Ratio (SNR)
) is the time defined between the
Aperture Delay
Aperture Jitter
AJ
), which is the
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