AD5162BRMZ100-RL7 Analog Devices Inc, AD5162BRMZ100-RL7 Datasheet - Page 12

• Manufacturer Part Number: AD5162BRMZ100-RL7
• Description: IC DGTL POT DUAL 100K 10-MSOP
• Manufacturer: Analog Devices Inc

Specifications of AD5162BRMZ100-RL7

• Taps: 256
• Resistance (ohms): 100K
• Number Of Circuits: 2
• Temperature Coefficient: 35 ppm/°C Typical
• Memory Type: Volatile
• Interface: SPI, 3-Wire Serial
• Voltage - Supply: 2.7 V ~ 5.5 V
• Operating Temperature: -40°C ~ 125°C
• Mounting Type: Surface Mount
• Package / Case: 10-MSOP, Micro10™, 10-uMAX, 10-uSOP
• Resistance In Ohms: 100K
• End To End Resistance: 100kohm
• Track Taper: Linear
• No. Of Steps: 256
• Resistance Tolerance: ± 20%
• Supply Voltage Range: 2.7V To 5.5V
• Control Interface: Serial, SPI
• No. Of Pots: Dual
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant
• For Use With: AD5162EVAL - BOARD EVAL FOR AD5162
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant, Lead free / RoHS Compliant

AD5162
TEST CIRCUITS
Figure 27 through Figure 32 illustrate the test circuits that define the test conditions used in the product specification tables (see Table 1
and Table 2).
Figure 27. Test Circuit for Potentiometer Divider Nonlinearity Error
V
Figure 28. Test Circuit for Resistor Position Nonlinearity Error
MS2
Figure 29. Test Circuit for Wiper Resistance
V+
NO CONNECT
(Rheostat Operation: R-INL, R-DNL)
A
B
DUT
W
A W
B
A
DUT
B
DUT
W
V
(INL, DNL)
W
V
MS1
I
W
= V
R
V+ = V
1LSB = V+/2
V
DD
W
MS
V
= [V
MS
/R
I
NOMINAL
W
DD
MS1
– V
N
MS2
]/I
W
Rev. C | Page 12 of 20
Figure 32. Test Circuit for Common-Mode Leakage Current
OFFSET
V+
GND
Figure 30. Test Circuit for Power Supply Sensitivity
∆V
V
Figure 31. Test Circuit for Gain vs. Frequency
DD
DD
V
IN
V
A
A
B
2.5V
GND
DUT
DUT
W
NC
NC
A
A
B
B
W
(PSS, PSSR)
NC = NO CONNECT
DUT
W
V
MS
V+ = V
PSRR (dB) = 20 LOG
PSS (%/%) =
I
CM
AD8610
DD
+15V
–15V
± 10%
∆V
∆V
MS
DD
V
CM
%
%
(
V
∆V
∆V
OUT
MS
DD
)