AD5160BRJ5-R2 Analog Devices Inc, AD5160BRJ5-R2 Datasheet - Page 12

• Manufacturer Part Number: AD5160BRJ5-R2
• Description: IC POT DGTL 5K 256POS SOT23-8
• Manufacturer: Analog Devices Inc

Specifications of AD5160BRJ5-R2

• Rohs Status: RoHS non-compliant
• Taps: 256
• Resistance (ohms): 5K
• Number Of Circuits: 1
• Temperature Coefficient: 45 ppm/°C Typical
• Memory Type: Volatile
• Interface: SPI, 3-Wire Serial
• Voltage - Supply: 2.7 V ~ 5.5 V
• Operating Temperature: -40°C ~ 125°C
• Mounting Type: Surface Mount
• Package / Case: SOT-23-8
• Resistance In Ohms: 5K
• For Use With: AD5160EVAL - BOARD EVAL FOR AD5160
• Other names: AD5160BRJ5-R2TR

AD5160
TEST CIRCUITS
Figure 28 to Figure 36 illustrate the test circuits that define the test conditions used in the product specification tables.
Figure 28. Test Circuit for Potentiometer Divider Nonlinearity Error (INL, DNL)
Figure 31. Test Circuit for Power Supply Sensitivity (PSS, PSSR)
Figure 29. Test Circuit for Resistor Position Nonlinearity Error
V
V+
MS2
OFFSET
GND
Figure 30. Test Circuit for Wiper Resistance
V
DD
Figure 32. Test Circuit for Inverting Gain
V+
(Rheostat Operation; R-INL, R-DNL)
NO CONNECT
V
A
A
B
A
DUT
B
V
IN
W
W
DUT
A
B
A
A
B
DUT
W
OFFSET
BIAS
W
DUT
V
W
V
B
W
MS1
V
MS
PSRR (dB) = 20 LOG
PSS (%/%) =
V+ = V
I
W
OP279
= V
V+ = V
1LSB = V+/2
V
R
5V
MS
V
DD
DD
W
MS
= [V
/ R
DD
I
10%
W
NOMINAL
MS1
ΔV
ΔV
N
MS
DD
– V
V
%
%
OUT
MS2
(
ΔV
ΔV
]/I
MS
DD
W
)
Rev. B | Page 12 of 16
Figure 36. Test Circuit for Common-Mode Leakage Current
OFFSET
Figure 35. Test Circuit for Incremental On Resistance
GND
OFFSET
Figure 34. Test Circuit for Gain vs. Frequency
Figure 33. Test Circuit for Noninverting Gain
V
V
GND
V
DD
SS
IN
2.5V
DUT
GND
DUT
B
V
IN
W
DUT
OFFSET
BIAS
NC
NC
A
A
B
B
I
A
SW
DUT
W
NC = NO CONNECT
V
SS
W
CODE = 0x00
R
W
SW
TO V
B
=
OP279
0.1V
DD
I
I
SW
5V
AD8610
CM
–15V
+15V
0.1V
V
V
OUT
CM
V
OUT