AD5754BREZ Analog Devices Inc, AD5754BREZ Datasheet - Page 8

• Manufacturer Part Number: AD5754BREZ
• Description: IC DAC 16BIT DSP/SRL 24TSSOP
• Manufacturer: Analog Devices Inc

Specifications of AD5754BREZ

• Data Interface: Serial
• Design Resources: Software Configurable 16-Bit Quad-Channel Unipolar/Bipolar Voltage Output Using AD5754 (CN0086)
• Settling Time: 10µs
• Number Of Bits: 16
• Number Of Converters: 4
• Voltage Supply Source: Analog and Digital, Dual ±
• Power Dissipation (max): 310mW
• Operating Temperature: -40°C ~ 85°C
• Mounting Type: Surface Mount
• Package / Case: 24-TSSOP Exposed Pad, 24-eTSSOP, 24-HTSSOP
• Resolution (bits): 16bit
• Sampling Rate: 100kSPS
• Input Channel Type: Serial
• Supply Voltage Range - Digital: 2.7V To 5.5V
• Supply Current: 2.5mA
• Digital Ic Case Style: TSSOP
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant

AD5724/AD5734/AD5754
ABSOLUTE MAXIMUM RATINGS
T
Transient currents of up to 100 mA do not cause SCR latch-up.
Table 4.
Parameter
AV
AV
DV
Digital Inputs to GND
Digital Outputs to GND
REFIN to GND
V
DAC_GND to GND
SIG_GND to GND
Operating Temperature Range, T
Storage Temperature Range
Junction Temperature, T
24-Lead TSSOP Package
Power Dissipation
Lead Temperature
ESD (Human Body Model)
OUT
A
Industrial
θ
θ
Soldering
DD
SS
CC
= 25°C, unless otherwise noted.
A, V
JA
JC
to GND
to GND
to GND
Thermal Impedance
Thermal Impedance
OUT
B, V
OUT
C, V
OUT
D to GND
J
max
A
Rating
−0.3 V to +17 V
+0.3 V to −17 V
−0.3 V to +7 V
−0.3 V to DV
(whichever is less)
−0.3 V to DV
(whichever is less)
−0.3 V to +5 V
AV
−0.3 V to +0.3 V
−0.3 V to +0.3 V
−40°C to +85°C
−65°C to +150°C
150°C
42°C/W
9°C/W
(T
JEDEC industry standard
J-STD-020
3.5 kV
J
SS
max − T
to AV
DD
A
)/ θ
CC
CC
+ 0.3 V or 7 V
+ 0.3 V or 7 V
JA
Rev. C | Page 8 of 32
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.
ESD CAUTION